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gamma-丁内酯-3-基异丁烯酸酯 | 130224-95-2

中文名称
gamma-丁内酯-3-基异丁烯酸酯
中文别名
——
英文名称
β-methacryloyloxy-γ-butyrolactone
英文别名
γ-butyrolactone-3-yl methacrylate;β-hydroxy-γ-butyrolactone methacrylate;β-(meth)acryloyloxy-γ-butyrolactone;γ-butyrolactone-3-ylmethacrylate;2-Propenoic acid, 2-methyl-, tetrahydro-5-oxo-3-furanyl ester;(5-oxooxolan-3-yl) 2-methylprop-2-enoate
gamma-丁内酯-3-基异丁烯酸酯化学式
CAS
130224-95-2
化学式
C8H10O4
mdl
——
分子量
170.165
InChiKey
ZROFAXCQYPKWCY-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

物化性质

  • 熔点:
    21 °C
  • 沸点:
    296.8±33.0 °C(Predicted)
  • 密度:
    1.17±0.1 g/cm3(Predicted)
  • 溶解度:
    溶于甲醇

计算性质

  • 辛醇/水分配系数(LogP):
    0.7
  • 重原子数:
    12
  • 可旋转键数:
    3
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    0.5
  • 拓扑面积:
    52.6
  • 氢给体数:
    0
  • 氢受体数:
    4

安全信息

  • 储存条件:
    0-10°C

SDS

SDS:c2fcb4eb551ec528304d365d606fab6e
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上下游信息

  • 上游原料
    中文名称 英文名称 CAS号 化学式 分子量

反应信息

  • 作为产物:
    描述:
    (±)-3-羟基-r-丁内酯 在 magnesium sulfate 、 三乙胺 作用下, 以 二氯甲烷甲基丙烯酰氯 为溶剂, 生成 gamma-丁内酯-3-基异丁烯酸酯
    参考文献:
    名称:
    Process for preparing &bgr;-hydroxy-&ggr;-butyrolactones and &bgr;-(meth)acryloyloxy-&ggr;-butrolactones
    摘要:
    本发明提供了一种制备β-羟基-γ-丁内酯或β-甲基-β-羟基-γ-丁内酯的方法,其化学式为(1):其中R1为氢或甲基,包括a)氰化环氧乙烷或2-甲基-2,3-环氧丙烷,b)水解步骤a)的产物,c)内酯化步骤b)的产物。
    公开号:
    US06313321B1
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文献信息

  • ACID GENERATORS AND PHOTORESISTS COMPRISING SAME
    申请人:Rohm and Haas Electronic Materials, LLC
    公开号:US20160002199A1
    公开(公告)日:2016-01-07
    Acid generator compounds are provided that are particularly useful as photoresist composition components. Preferred acid generators include cyclic sulfonium compounds that comprise a covalently linked acid-labile group.
    提供了一些作为光刻胶组分特别有用的酸发生剂化合物。首选的酸发生剂包括含有共价连接的酸敏感基团的环状硫铵化合物。
  • MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS
    申请人:Rohm and Haas Electronic Materials Korea Ltd.
    公开号:US20180059545A1
    公开(公告)日:2018-03-01
    In one preferred embodiment, polymers are provided that comprise a structure of the following Formula (I): Photoresists that comprises such polymers also are provided.
    在一个首选实施例中,提供了包含以下化学式(I)结构的聚合物: 还提供了包含这种聚合物的光刻胶。
  • Salt suitable for an acid generator and a chemically amplified resist composition containing the same
    申请人:Harada Yukako
    公开号:US20070078269A1
    公开(公告)日:2007-04-05
    The present invention provides a salt of the formula (I): wherein ring Y represents monocyclic or polycyclic hydrocarbon group having 3 to 30 carbon atoms, in which one —CH 2 — group is substituted with —COO— group, and at least one hydrogen atom in the monocyclic or polycyclic hydrocarbon group may optionally be substituted with alkyl group having 1 to 6 carbon atom, alkoxy group having 1 to 6 carbon atom, perfluoroalkyl group having 1 to 4 carbon atoms, hydroxyalkyl group having 1 to 6 carbon atoms, hydroxyl group or cyano group; Q 1 and Q 2 each independently represent fluorine atom or perfluoroalkyl group having 1 to 6 carbon atoms; A + represents organic counter ion; and n shows an integer of 0 to 12. The present invention also provides a chemically amplified resist composition comprising the salt of the formula (I).
    本发明提供了一种具有公式(I)的盐: 其中环Y代表具有3至30个碳原子的单环或多元环烃基团,其中一个—CH2—基团被—COO—基团取代,并且单环或多元环烃基团中的至少一个氢原子可以可选地被具有1至6个碳原子的烷基取代,具有1至6个碳原子的烷氧基,具有1至4个碳原子的全氟烷基,具有1至6个碳原子的羟基烷基,羟基或腈基;Q1和Q2各自独立地代表氟原子或具有1至6个碳原子的全氟烷基;A+代表有机反离子;n表示0至12的整数。 本发明还提供了一种含有公式(I)盐的化学放大抗蚀剂组合物。
  • SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME
    申请人:ICHIKAWA Koji
    公开号:US20100304293A1
    公开(公告)日:2010-12-02
    A salt represented by the formula (a): wherein Q 1 and Q 2 each independently represent a fluorine atom etc., X 1 represents a single bond etc., X 2 represents a single bond etc., Y 1 represents a C3-C6 alicyclic hydrocarbon group etc., with the proviso that —X 2 —Y 1 group has one or more fluorine atoms, and Z + represents an organic counter cation, and a photoresist composition comprising the salt represented by the formula (a) and a resin comprising a structural unit having an acid-labile group and being insoluble or poorly soluble in an aqueous alkali solution but becoming soluble in an aqueous alkali solution by the action of an acid.
    由公式(a)表示的盐:其中Q1和Q2各自独立代表氟原子等,X1代表单键等,X2代表单键等,Y1代表C3-C6的脂环烃基等,但条件是—X2—Y1基团具有一个或多个氟原子,以及Z+代表有机反离子,以及包含由公式(a)表示的盐的光阻剂组合物和包含具有酸不稳定的基团并且在水性碱液中不溶或微溶于但在酸性作用下水性碱液中变得可溶的树脂的结构单元。
  • MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:SHIN-ETSU CHEMICAL CO., LTD.
    公开号:US20150322027A1
    公开(公告)日:2015-11-12
    A monomer (1) is prepared by reacting a compound (9) with a base or metal to form a metal enolate reagent, and reacting the metal enolate reagent with an acyloxyketone compound (8). A polymer derived from the monomer is used as base resin to formulate a resist composition, which is shelf stable and displays a high dissolution contrast, controlled acid diffusion and low roughness in forming positive pattern via alkaline development and in forming negative pattern via organic solvent development.
    一种单体(1)是通过将一种化合物(9)与碱或金属反应形成金属烯醇盐试剂,然后将金属烯醇盐试剂与一种酰氧基酮化合物(8)反应而制备的。由该单体派生出的聚合物用作基础树脂,以配制一种光刻胶组合物,该组合物在常温下稳定,显示出高溶解对比度、控制的酸性扩散和在碱性显影形成正图案以及有机溶剂显影形成负图案时低粗糙度。
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