Microwave dielectric relaxation of ferroelectric PLZT ceramics in the range of 300-900 K
作者:A. Mouhsen、M. E. Achour、J. L. Miane、J. Ravez
DOI:10.1051/epjap:2001171
日期:2001.8
Dielectric response of PLZT(x/65/35) ceramics (with x = 0, 2, 4, 5) was studied using radio frequency and microwave techniques in the temperature range 300−900 K and with a frequency range of 102 Hz-3 × 109 Hz. Dielectric relaxation appears around 1 × 109 Hz at room temperature. The relaxation frequency softens at Tc and the dielectric relaxation exists in both paraelectric and ferroelectric phases and depends on x the lanthanum concentration. A model of correlation chains gives some keys for understanding the frequency behaviour of such materials.
PLZT(x/65/35) 陶瓷(其中 x = 0, 2, 4, 5)的介电响应在温度范围 300−900 K 及频率范围 102 Hz-3 × 109 Hz 下采用射频和微波技术进行研究。介电松弛在室温下出现在 1 × 109 Hz 附近。在 Tc 处,松弛频率出现软化,介电松弛同时存在于顺电和铁电相中,并依赖于铈浓度 x。相关链模型为理解此类材料的频率行为提供了一些线索。