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2-Hydroxy-5-oxo-4-oxatricyclo[4.2.1.03,7]nonane-6-carboxylic acid | 1189185-40-7

中文名称
——
中文别名
——
英文名称
2-Hydroxy-5-oxo-4-oxatricyclo[4.2.1.03,7]nonane-6-carboxylic acid
英文别名
——
2-Hydroxy-5-oxo-4-oxatricyclo[4.2.1.03,7]nonane-6-carboxylic acid化学式
CAS
1189185-40-7
化学式
C9H10O5
mdl
——
分子量
198.175
InChiKey
LZGWBNWSMNMDTI-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    0.2
  • 重原子数:
    14
  • 可旋转键数:
    1
  • 环数:
    3.0
  • sp3杂化的碳原子比例:
    0.78
  • 拓扑面积:
    83.8
  • 氢给体数:
    2
  • 氢受体数:
    5

上下游信息

  • 上游原料
    中文名称 英文名称 CAS号 化学式 分子量
  • 下游产品
    中文名称 英文名称 CAS号 化学式 分子量

反应信息

点击查看最新优质反应信息

文献信息

  • PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM
    申请人:Enomoto Yuichiro
    公开号:US20120282548A1
    公开(公告)日:2012-11-08
    Provided is a pattern forming method comprising (i) a step of forming a film from an actinic ray-sensitive or radiation-sensitive resin composition, (ii) a step of exposing the film, and (iii) a step of developing the exposed film by using an organic solvent-containing developer, wherein the actinic ray-sensitive or radiation-sensitive resin composition comprises (A) a resin capable of decreasing the solubility for an organic solvent-containing developer by the action of an acid, (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, (D) a solvent, and (G) a compound having at least either one of a fluorine atom and a silicon atom and having basicity or being capable of increasing the basicity by the action of an acid.
    提供的是一种形成图案的方法,包括(i)使用光致或辐射敏感树脂组成物形成薄膜的步骤,(ii)曝光薄膜的步骤,以及(iii)使用有机溶剂含有的显影剂显影曝光后的薄膜的步骤,其中光致或辐射敏感树脂组成物包括(A)一种能够通过酸的作用降低有机溶剂含有的显影剂的溶解度的树脂,(B)一种能够在光致或辐射照射下生成酸的化合物,(D)一种溶剂,以及(G)一种具有氟原子和硅原子中的至少一种,并具有碱性或能够通过酸的作用增加碱性的化合物。
  • COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
    申请人:Sumitomo Chemical Company, Limited
    公开号:EP3581594B1
    公开(公告)日:2021-12-29
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD USING THE SAME, POLYMERIZABLE COMPOUND AND POLYMER COMPOUND OBTAINED BY POLYMERIZING THE POLYMERIZABLE COMPOUND
    申请人:YAMAGUCHI Shuhei
    公开号:US20090246695A1
    公开(公告)日:2009-10-01
    An actinic ray-sensitive or radiation-sensitive resin composition and a pattern forming method using the composition are provided, the composition including (A) a resin containing a repeating unit having a group represented by formula (1) as defined in the specification, the resin being capable of increasing a solubility of the resin in an alkali developer by an action of an acid, and (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; and a polymerizable compound represented by formula (M-1) as defined in the specification and a polymer compound obtained by polymerizing the polymerizable compound are provided.
  • POLYMERIZABLE COMPOUND, LACTONE-CONTAINING COMPOUND, METHOD FOR MANUFACTURING LACTONE-CONTAINING COMPOUND AND POLYMER COMPOUND OBTAINED BY POLYMERIZING THE POLYMERIZABLE COMPOUND
    申请人:IIZUKA Yusuke
    公开号:US20100152400A1
    公开(公告)日:2010-06-17
    A polymerizable compound having a lactone structure represented by formula (1) is provided: wherein A represents a polymerizable site; R 2 represents a single bond or an alkylene group; R 3 represents a hydrocarbon group in which hydrogen atoms are substituted with a fluorine atom; R 4 represents a halogen atom, a cyano group, a hydroxy group, an amide group, an alkyl group, a cycloalkyl group, an alkoxy group, a phenyl group, an acyl group, an alkoxycarbonyl group, or a group represented by R—C(═O)— or R—C(═O)O—, wherein R represents an alkyl group or a cycloalkyl group; X represents an alkylene group, an oxygen atom or a sulfur atom; Z represents a single bond, an ether bond, an ester bond, an amide bond, a urethane bond or a urea bond; n represents an integer of from 0 to 5; and m represents an integer of from 0 to 7.
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
    申请人:Hirano Shuji
    公开号:US20110236828A1
    公开(公告)日:2011-09-29
    An actinic ray-sensitive or radiation-sensitive resin composition, includes: (A) a resin capable of increasing the solubility of the resin (A) in an alkali developer by the action of an acid; and (C) a resin having at least either a fluorine atom or a silicon atom and containing (c) a repeating unit having at least two or more polarity conversion groups.
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