PHOTORESIST TOPCOAT COMPOSITIONS AND METHODS OF PROCESSING PHOTORESIST COMPOSITIONS
申请人:Rohm and Haas Electronic Materials LLC
公开号:US20190203065A1
公开(公告)日:2019-07-04
Photoresist topcoat compositions, comprising: a first polymer that is aqueous base soluble and is present in an amount of from 70 to 99 wt % based on total solids of the composition; a second polymer comprising a repeat unit of general formula (IV) and a repeat unit of general formula (V):
wherein: R
5
independently represents H, halogen atom, C1-C3 alkyl, or C1-C3 haloalkyl; R
6
represents linear, branched or cyclic C1 to C20 fluoroalkyl; R
7
represents linear, branched or cyclic C1 to C20 fluoroalkyl; L
3
represents a multivalent linking group; and m is an integer of from 1 to 5; wherein the second polymer is free of non-fluorinated side chains; and wherein the second polymer is present in an amount of from 1 to 30 wt % based on total solids of the composition and a solvent. The invention finds particular applicability in the manufacture of semiconductor devices.