申请人:Shin-Etsu Chemical Co., Ltd.
公开号:US20020161150A1
公开(公告)日:2002-10-31
An ether compound of formula (1) is provided wherein R
1
is H or C
1-6
alkyl, R
2
is C
1-6
alkyl, R
3
is H, C
1-15
acyl or C
1-15
alkoxycarbonyl which may be substituted with halogen atoms, k is 0 or 1, m is from 0 to 3, and n is from 3 to 6. The ether compound is polymerized to form a polymer having improved reactivity, robustness and substrate adhesion. A resist composition comprising the polymer as a base resin is sensitive to high-energy radiation, has excellent sensitivity, resolution, and etching resistance, and lends itself to micropatterning with electron beams or deep-UV.
1
提供了一种化学式为(1)的醚化合物,其中R1为H或C1-6烷基,R2为C1-6烷基,R3为H,C1-15酰基或C1-15烷氧羰基,可以用卤素原子取代,k为0或1,m为0到3,n为3到6。该醚化合物聚合形成具有改进反应性、坚固性和基底附着性的聚合物。以该聚合物为基础树脂的抗蚀剂组合物对高能辐射敏感,具有优异的敏感性、分辨率和蚀刻抵抗性,并适用于电子束或深紫外线微图案化。