Described herein are compositions for forming an underlayer film for a solvent-developable resist. These compositions can include a hydrolyzable organosilane having a silicon atom bonded to an organic group containing a protected aliphatic alcohol group, a hydrolysate of the hydrolyzable organosilane, a hydrolysis-condensation product of the hydrolyzable organosilane, or a combination thereof and a solvent. The composition can form a resist underlayer film including, a hydrolyzable organosilane, a hydrolysate of the hydrolyzable organosilane, a hydrolysis-condensation product of the hydrolyzable organosilane, or a combination thereof, the silicon atom in the silane compound having a silicon atom bonded to an organic group containing a protected aliphatic alcohol group in a ratio of 0.1 to 40% by mol based on the total amount of silicon atoms. Also described is a method for applying the composition onto a semiconductor substrate and baking the composition to form a resist underlayer film.
本文描述了用于制备可溶剂显影光阻的底层膜的组合物。这些组合物可以包括一种可
水解的有机
硅烷,其
硅原子与含有保护性
脂肪醇基团的有机基团键合,可
水解有机
硅烷的
水解物,可
水解有机
硅烷的
水解缩合产物,或其组合物和溶剂。该组合物可以形成一个光阻底层膜,包括可
水解有机
硅烷,可
水解有机
硅烷的
水解物,可
水解有机
硅烷的
水解缩合产物或其组合物,
硅烷化合物中的
硅原子与含有保护性
脂肪醇基团的有机基团的比例为总
硅原子量的0.1至40%的摩尔比。还描述了一种将该组合物涂覆在半导体基板上并烘烤以形成光阻底层膜的方法。