本文讨论了与薄膜和多层箔有关的蠕变变形。我们首先回顾了用于研究薄膜几何形态下蠕变变形的实验技术,列出了每种技术的优缺点;然后我们讨论了使用变形机制图来记录和理解观察到的蠕变行为。我们包括了一些关于微观结构稳定性、零蠕变应力和瞬态蠕变应变对应力-应变率关系的影响的警告性言论,最后回顾了目前关于薄膜蠕变变形的知识状态。这既包括在基板上加热的薄膜,也包括作为自由箔进行测试的多层膜。
The following are commentaries provided by representatives from industry. These short articles lend an additional context in which to appreciate the importance of the issues and mechanisms discussed in the technical articles. The authors of the commentaries point out that the basic principles that underlie the influence of scale on material behavior are not only interesting in their own right, but also are directly applicable to issues of great significance to designers and manufacturers of small-scale devices and structures. In addition, directions for future emphasis are suggested.
In this article, we discuss creep deformation as it relates to thin films and multilayer foils. We begin by reviewing experimental techniques for studying creep deformation in thin-film geometries, listing the pros and cons of each; then we discuss the use of deformation-mechanism maps for recording and understanding observed creep behavior. We include a number of cautionary remarks regarding the impact of microstructural stability, zero-creep stresses, and transient-creep strains on stress–strain rate relationships, and we finish by reviewing the current state of knowledge for creep deformation in thin films. This includes both thin films that are heated on substrates as well as multilayer films that are tested as freestanding foils.
本文讨论了与薄膜和多层箔有关的蠕变变形。我们首先回顾了用于研究薄膜几何形态下蠕变变形的实验技术,列出了每种技术的优缺点;然后我们讨论了使用变形机制图来记录和理解观察到的蠕变行为。我们包括了一些关于微观结构稳定性、零蠕变应力和瞬态蠕变应变对应力-应变率关系的影响的警告性言论,最后回顾了目前关于薄膜蠕变变形的知识状态。这既包括在基板上加热的薄膜,也包括作为自由箔进行测试的多层膜。