蒽用固体氯化铜 (II) 选择性氯化,得到定量的 9-氯蒽。迄今为止提出的暂定反应机制未能解释一些其他烃同系物(例如萘和菲)对氯化铜 (II) 的非反应性。本研究表明,所有反应性烃类同系物的氧化半波电位 (E1⁄2ox) 均小于 1.26 V。基于这一发现,我们假设一个反应机制涉及从烃类到氯化铜 (II) 的一个电子转移.
Anthracene is selectively chlorinated with solid copper(II) chloride to give a quantitative yield of 9-chloroanthracene. The tentative reaction mechanisms so far proposed fail to explain the nonreactivity of some other hydrocarbon homologues, e.g. naphthalene and phenanthrene, toward copper(II) chloride. The present study revealed that the oxidative half-wave potentials (E1⁄2ox) of all reactive hydrocarbon
蒽用固体氯化铜 (II) 选择性氯化,得到定量的 9-氯蒽。迄今为止提出的暂定反应机制未能解释一些其他烃同系物(例如萘和菲)对氯化铜 (II) 的非反应性。本研究表明,所有反应性烃类同系物的氧化半波电位 (E1⁄2ox) 均小于 1.26 V。基于这一发现,我们假设一个反应机制涉及从烃类到氯化铜 (II) 的一个电子转移.
Method and apparatus for inspecting photosensitive material for surface defects
申请人:FUJI PHOTO FILM CO., LTD.
公开号:US20030090653A1
公开(公告)日:2003-05-15
The surface defect inspection method and apparatus are capable of inspecting a photosensitive material for defective surface portions with efficiency by using a reflex-type optical sensor. The surface defect inspection apparatus has a reflex-type optical sensor. A thermal-developable photosensitive material is irradiated with inspection light from a light source. Reflected light from the photosensitive material is received by a light-receiving portion of the optical sensor and a defective surface portion is detected from the reflected light. A mask is attached to the light-receiving portion to cut out specular reflected light, thereby enabling a change in the quantity of diffuse reflected light to be directly detected. Therefore, even a defective surface portion where only a small diffuse reflectance is recognized can be detected with efficiency.