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ethynyl ion | 16456-59-0

中文名称
——
中文别名
——
英文名称
ethynyl ion
英文别名
ethynylium;ethyne
ethynyl ion化学式
CAS
16456-59-0
化学式
C2H
mdl
——
分子量
25.0299
InChiKey
UAYUAPRVBCKABF-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    0.4
  • 重原子数:
    2
  • 可旋转键数:
    0
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.0
  • 拓扑面积:
    0
  • 氢给体数:
    0
  • 氢受体数:
    0

SDS

SDS:e47c3c83d59e75f44238ef75b48d1ee6
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反应信息

  • 作为产物:
    描述:
    参考文献:
    名称:
    High-resolution pulsed field ionization photoelectron-photoion coincidence study of C2H2: Accurate 0 K dissociation threshold for C2H+
    摘要:
    By employing the newly developed pulsed field ionization photoelectron-photoion coincidence (PFI-PEPICO) apparatus of the Chemical Dynamics Beamline at the Advanced Light Source, we have examined the formation of ethynyl ion (C2H+) from acetylene at high resolution. The PFI-PEPICO (C2H2) time-of-flight spectra reveal that fragmentation of in C2H2 high-n Rydberg states occurs at energies above the dissociation threshold prior to pulsed field ionization. This study shows that for a prompt dissociation process, the disappearance energy of the parent molecule determined in PFI-PEPICO measurements provides an unambiguous measure of the 0 K ion dissociation threshold. For the formation of from this is found C2H+ C2H2 to be 17.3576 +/- 0.0010 eV.
    DOI:
    10.1039/a907383c
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文献信息

  • Plessis, Pierre; Marmet, Paul, Canadian Journal of Chemistry, 1987, vol. 65, p. 1424 - 1432
    作者:Plessis, Pierre、Marmet, Paul
    DOI:——
    日期:——
  • The heat of formation of C<sub>2</sub>H<sup>+</sup>
    作者:Y. Ono、C. Y. Ng
    DOI:10.1063/1.441068
    日期:1981.6.15
    The heat of formation of C2H+→C2H++H is considered.(AIP)
  • High-resolution pulsed field ionization photoelectron-photoion coincidence study of C2H2: Accurate 0 K dissociation threshold for C2H+
    作者:G. K. Jarvis、Karl-Michael Weitzel、Marcus Malow、Tomas Baer、Y. Song、C. Y. Ng
    DOI:10.1039/a907383c
    日期:——
    By employing the newly developed pulsed field ionization photoelectron-photoion coincidence (PFI-PEPICO) apparatus of the Chemical Dynamics Beamline at the Advanced Light Source, we have examined the formation of ethynyl ion (C2H+) from acetylene at high resolution. The PFI-PEPICO (C2H2) time-of-flight spectra reveal that fragmentation of in C2H2 high-n Rydberg states occurs at energies above the dissociation threshold prior to pulsed field ionization. This study shows that for a prompt dissociation process, the disappearance energy of the parent molecule determined in PFI-PEPICO measurements provides an unambiguous measure of the 0 K ion dissociation threshold. For the formation of from this is found C2H+ C2H2 to be 17.3576 +/- 0.0010 eV.
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