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2-(3-chlorocarbonyl-butyl)-3-methyl-succinic acid-anhydride | 856062-42-5

中文名称
——
中文别名
——
英文名称
2-(3-chlorocarbonyl-butyl)-3-methyl-succinic acid-anhydride
英文别名
2-(3-Chlorcarbonyl-butyl)-3-methyl-bernsteinsaeure-anhydrid;2-Methyl-4-(4-methyl-2,5-dioxooxolan-3-yl)butanoyl chloride
2-(3-chlorocarbonyl-butyl)-3-methyl-succinic acid-anhydride化学式
CAS
856062-42-5
化学式
C10H13ClO4
mdl
——
分子量
232.664
InChiKey
WIVRRVZBNNNGOY-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    1.9
  • 重原子数:
    15
  • 可旋转键数:
    4
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    0.7
  • 拓扑面积:
    60.4
  • 氢给体数:
    0
  • 氢受体数:
    4

上下游信息

  • 上游原料
    中文名称 英文名称 CAS号 化学式 分子量

反应信息

  • 作为反应物:
    描述:
    2-(3-chlorocarbonyl-butyl)-3-methyl-succinic acid-anhydride4-溴苯胺乙醚 作用下, 生成 3,6-bis-(4-bromo-phenylcarbamoyl)-2-methyl-heptanoic acid
    参考文献:
    名称:
    Dimensional measurement of high aspect ratio micro structures with a resonating micro cantilever probe
    摘要:
    In non-destructive dimensional measurement of high aspect ratio micro structures (HARMS), optical methods cannot offer full three dimensional information due to the lack of observation light. Again, conventional mechanical measurement, such as a surface profiler or a coordinate measurement machine, cannot be applied because their stylus is too large. Furthermore, the AFM, though popular among the semiconductor industry, is also limited in terms of dimensional measurement, because its system is usually designed for planar samples. Thus, we have developed a new sensor-integrated micro resonating cantilever probe and a new dimensional measurement machine, which allows the probe's vertical access to microstructures in a sample. The new probe is made of tungsten carbide super hard alloy and possesses design flexibility according to its intended application. Validity of the system is confirmed through the measurement experiment of EDM drilled and chemically etched micro holes.
    DOI:
    10.1007/s005429900037
  • 作为产物:
    参考文献:
    名称:
    Dimensional measurement of high aspect ratio micro structures with a resonating micro cantilever probe
    摘要:
    In non-destructive dimensional measurement of high aspect ratio micro structures (HARMS), optical methods cannot offer full three dimensional information due to the lack of observation light. Again, conventional mechanical measurement, such as a surface profiler or a coordinate measurement machine, cannot be applied because their stylus is too large. Furthermore, the AFM, though popular among the semiconductor industry, is also limited in terms of dimensional measurement, because its system is usually designed for planar samples. Thus, we have developed a new sensor-integrated micro resonating cantilever probe and a new dimensional measurement machine, which allows the probe's vertical access to microstructures in a sample. The new probe is made of tungsten carbide super hard alloy and possesses design flexibility according to its intended application. Validity of the system is confirmed through the measurement experiment of EDM drilled and chemically etched micro holes.
    DOI:
    10.1007/s005429900037
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