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yttrium(III) (dipivaloylmethanate)3

中文名称
——
中文别名
——
英文名称
yttrium(III) (dipivaloylmethanate)3
英文别名
2,2,6,6-Tetramethylheptane-3,5-dione; yttrium;2,2,6,6-tetramethylheptane-3,5-dione;yttrium
yttrium(III) (dipivaloylmethanate)3化学式
CAS
——
化学式
C33H60O6Y
mdl
——
分子量
641.742
InChiKey
OQYNKAIYQJLEJA-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    7.82
  • 重原子数:
    40
  • 可旋转键数:
    6
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.82
  • 拓扑面积:
    102
  • 氢给体数:
    0
  • 氢受体数:
    6

反应信息

  • 作为反应物:
    描述:
    yttrium(III) (dipivaloylmethanate)3 、 lithium phthalocyanine, Li(Pc2-) 以 四氢呋喃 为溶剂, 生成 [Y(3+)(Pc)(1-)(dpm)2] radical
    参考文献:
    名称:
    酞菁自由基的一些稀土配合物的制备和表征
    摘要:
    稀土元素三(2,2,6,6-四甲基-3,5-庚二酮)配合物的反应,M3+(dpm)3 (M = Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er、Tm、Yb、Lu 和 Y) 与四氢呋喃中的锂酞菁 Li2(Pc2-) 生成新的稳定的酞菁自由基复合物 [M3+(Pc-·)(dpm)2]。
    DOI:
    10.1246/cl.1983.1167
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文献信息

  • Organometallic chemical vapor deposition of high<i>T</i><sub><i>c</i></sub>superconducting films using a volatile, fluorocarbon‐based precursor
    作者:Jing Zhao、Klaus‐Hermann Dahmen、Henry O. Marcy、Lauren M. Tonge、Tobin J. Marks、Bruce W. Wessels、Carl R. Kannewurf
    DOI:10.1063/1.100473
    日期:1988.10.31
    Uniform films of the high Tc superconductor YBa2Cu3O7−δ have been prepared by organometallic chemical vapor deposition using the volatile metalorganic precursors Cu(acetylacetonate)2, Y(dipivaloylmethanate)3, and Ba(heptafluorodimethyloctanedionate)2. With argon as a carrier gas and water vapor as a reactant, film growth rates of 10–30 nm/min are achieved. After annealing under oxygen, energy dispersive
    高 Tc 超导体 YBa2Cu3O7-δ 的均匀薄膜已通过有机化学气相沉积制备,使用挥发性属有机前体 Cu(乙酰丙酮)2、Y(二新戊酰甲烷)3 和 Ba(七二甲基辛二酸)2。以气为载气,蒸气为反应物,薄膜生长速度可达 10-30 nm/min。在氧气下退火后,能量色散 X 射线分析、轮廓测定和 X 射线衍射数据表明,[100] 单晶 MgO 上的这种 YBa2Cu3O7-δ 薄膜具有良好的成分和尺寸均匀性以及微晶 c 轴的优先取向垂直于基板表面。四探针电阻率测量显示,在 90 K 时开始超导,66.2 K 时电阻为零。
  • Superconducting properties of Ba<sub>2</sub>YCu<sub>3</sub>O<sub>7−<i>x</i></sub>thin films prepared by chemical vapor deposition on SrTiO<sub>3</sub>and a metal substrate
    作者:Taichi Yamaguchi、Shinya Aoki、Nobuyuki Sadakata、Osamu Kohno、Hiroshi Osanai
    DOI:10.1063/1.102311
    日期:1989.10.9
    Superconducting Ba2 YCu3 O7−x thin films were prepared by chemical vapor deposition using β‐diketonate chelates on SrTiO3 single crystalline substrates, metal substrates, and metal substrates with a polycrystalline SrTiO3 buffer. The temperatures of complete superconducting transitions were observed at 89, 81, and 84 K, respectively. Reduced critical current density of the film on a single crystalline
    SrTiO3 单晶衬底、属衬底和具有多晶 缓冲液的属衬底上,使用 β-二酮酸盐螯合物通过化学气相沉积制备超导 Ba2 YCu3 O7-x 薄膜。分别在 89、81 和 84 K 处观察到完全超导转变的温度。在 77 K 时高达 600 mT 的磁场中,单晶基板上薄膜的临界电流密度降低,但仍比粉末冶加工样品的临界电流密度高一两个数量级。根据 X 射线衍射图,在所有样品中都证实存在取向良好的正交 Ba2 YCu3 O7-x 结构。
  • In-situ growth of Y1Ba2Cu3O7−x thin films directly on sapphire by temperature-controlled chemical vapor deposition
    作者:Aiguo Feng、Li Luo、J. Martin、C.J. Maggiore
    DOI:10.1016/0921-4534(92)90875-d
    日期:1992.4
    A temperature-controlled chemical vapor deposition (TC-CVD) process was developed for in-situ growth of highly c-axis orientated Y1Ba2Cu3O7+x (YBCO) thin films directly on sapphire substrates. This new CVD process, for the first time, uses programmable temperature controllers to optimize and tailor the qualities of deposited YBCO films by precisely control the temperatures of substrates and source compounds in pre-determined temperature profiles. By employing a substrate temperature (T(s)) ramping from T(s) (high) of 825-degrees-C to T(s) (low) of 735-degrees-C during deposition, we were able to grow highest T(c) and J(c) YBCO thin films on sapphire without buffer layer. DC transport four point measurement on the as-deposited films gave a T(c(onset)) at 92 K and T(c(zero)) at 84 K. Critical current density of 4 x 10(4) A/cm2 at 77 K and zero magnetic field was obtained for the films. The as-deposited films were also characterized by scanning electron microscopy (SEM) and X-ray diffraction (XRD).
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