摩熵化学
数据库官网
小程序
打开微信扫一扫
首页 分子通 化学资讯 化学百科 反应查询 关于我们
请输入关键词

[6-Ethyl-3-(hydroxymethyl)-8-methyl-1,5-dioxocan-3-yl]methanol

中文名称
——
中文别名
——
英文名称
[6-Ethyl-3-(hydroxymethyl)-8-methyl-1,5-dioxocan-3-yl]methanol
英文别名
[6-ethyl-3-(hydroxymethyl)-8-methyl-1,5-dioxocan-3-yl]methanol
[6-Ethyl-3-(hydroxymethyl)-8-methyl-1,5-dioxocan-3-yl]methanol化学式
CAS
——
化学式
C11H22O4
mdl
——
分子量
218.29
InChiKey
QQYJGWIFVKKXFU-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    0.2
  • 重原子数:
    15
  • 可旋转键数:
    3
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    1.0
  • 拓扑面积:
    58.9
  • 氢给体数:
    2
  • 氢受体数:
    4

文献信息

  • COMPOUND, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND PATTERN FORMATION METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20160024005A1
    公开(公告)日:2016-01-28
    There is provided an actinic ray-sensitive or radiation-sensitive resin composition containing a compound represented by the following formula (1) or (2), and the formula (1) and (2) are defined as herein, and a resist film comprising the actinic ray-sensitive or radiation-sensitive resin composition, and a pattern forming method comprising a step of exposing the resist film, and a step of developing the exposed film, and a method for manufacturing an electronic device, comprising the pattern forming method, and an electronic device manufactured by the manufacturing method of an electronic device.
    提供了一种包含下列式子(1)或(2)所代表的化合物的光致射线敏感或辐射敏感的树脂组合物,其中式(1)和(2)的定义如本文所述,以及包括该光致射线敏感或辐射敏感的树脂组合物的光阻膜,以及包括曝光光阻膜的步骤和显影曝光膜的步骤的图案形成方法,以及包括图案形成方法的制造电子装置的方法,以及由电子装置的制造方法制造的电子装置。
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20150185612A1
    公开(公告)日:2015-07-02
    There is provided an actinic ray-sensitive or radiation-sensitive resin composition comprising: (A) a resin having a repeating unit represented by the specific formula and a group capable of decomposing by an action of an acid to produce a polar group; and an ionic compound represented by the specific formula, and a resist film comprising the actinic ray-sensitive or radiation-sensitive resin composition.
    提供一种光致射线敏感或辐射敏感的树脂组合物,包括:(A)具有特定公式表示的重复单元和能够通过酸作用分解产生极性基团的基团的树脂;以及具有特定公式表示的离子化合物,以及包括该光致射线敏感或辐射敏感的树脂组合物的抗蚀膜。
  • PATTERN FORMING METHOD, COMPOSITION KIT AND RESIST FILM, AND METHOD FOR PRODUCING ELECTRONIC DEVICE USING THEM, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20160018734A1
    公开(公告)日:2016-01-21
    There is provided a pattern forming method comprising (a) a step of forming a film on a substrate using an electron beam-sensitive or extreme ultraviolet radiation-sensitive resin composition, (b) a step of forming a top coat layer on the film using a top coat composition containing a resin (T) containing at least any one of repeating units represented by formulae (I-1) to (I-5) shown below, (c) a step of exposing the film having the top coat layer using an electron beam or an extreme ultraviolet radiation, and (d) a step of developing the film having the top coat layer after the exposure to form a pattern.
    提供了一种图案形成方法,包括以下步骤:(a)使用电子束敏感或极紫外辐射敏感的树脂组合物在基板上形成薄膜的步骤,(b)使用含有至少一个由下式(I-1)到(I-5)中所示的重复单元表示的树脂(T)的顶层涂料组成的顶层涂料层的形成步骤,(c)使用电子束或极紫外辐射照射具有顶层涂料层的薄膜的步骤,以及(d)在照射后开发具有顶层涂料层的薄膜以形成图案的步骤。
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    申请人:FUJIFILM Corporation
    公开号:US20150132687A1
    公开(公告)日:2015-05-14
    There is provided an actinic ray-sensitive or radiation-sensitive resin composition comprising (P) a resin containing a repeating unit represented by the specific formula (1) and a repeating unit represented by the specific formula (A); a resist film formed using the actinic ray-sensitive or radiation-sensitive resin composition; a pattern forming method comprising (i) a step of forming a film from the actinic ray-sensitive or radiation-sensitive resin composition, (ii) a step of exposing the film, and (iii) a step of developing the exposed film by using a developer to form a pattern; a method for manufacturing an electronic device, comprising the pattern forming method, and an electronic device manufactured by the manufacturing method of an electronic device.
  • PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
    申请人:FUJIFILM CORPORATION
    公开号:US20150168834A1
    公开(公告)日:2015-06-18
    There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).
查看更多