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tris(4-tert-butylphenyl)sulfonium-trifluoromethanesulfonate salt | 220155-94-2

中文名称
——
中文别名
——
英文名称
tris(4-tert-butylphenyl)sulfonium-trifluoromethanesulfonate salt
英文别名
tris(p-tert-butaneylphenyl)sulfonium trifluoromethanesulfonate;trifluoromethylsulfonate tri-p-tert-butylphenylsulfonium salt;tri(p-tert-butyl-phenyl)sulphonium trifluoromethanesulfonate;tri(p-tert-butylphenyl)sulfonium trifluoromethanesulphonate;tris(4-tert-butylphenyl)sulfonium trifluoromethanesulfonate;tris(p-tert-butylphenyl)sulfonium trifluoromethanesulfonate;tri(4-tert-butyl)phenylsulfonium trifluoromethanesulfonate;tri(p-tert-butylphenyl)sulfonium trifluoromethanesulfonate;Tri(p-tert.-butylphenyl)sulfonium trifluoromethansulfonat;Tri(p-tertbutylphenyl)sulfonium trifluoromethansulphonat;tris(4-t-butylphenyl)sulfonium trifluoromethanesulfonate;tris(p-t-butylphenyl)sulfonium trifluoromethanesulfonate;tri(4-t-butylphenyl)sulfonium trifluoromethanesulfonate;tris(4-tertiary butylphenyl)sulfonium triflate;tris(4-tert-butylphenyl)sulphonium triflate;tris(4-tert-butylphenyl)sulfonium triflate;tris(p-tert-butylphenyl)sulfonium triflate;tris(4-tert-Butylphenyl)sulfonium triflat;tris(4-t-butyl-phenyl)sulfonium triflate;Tris(4-tert-butylphenyl)sulfonium;trifluoromethanesulfonate;tris(4-tert-butylphenyl)sulfanium
tris(4-tert-butylphenyl)sulfonium-trifluoromethanesulfonate salt化学式
CAS
220155-94-2
化学式
CF3O3S*C30H39S
mdl
——
分子量
580.776
InChiKey
HHMQUQRJNPTPAJ-UHFFFAOYSA-M
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    8.73
  • 重原子数:
    39
  • 可旋转键数:
    6
  • 环数:
    3.0
  • sp3杂化的碳原子比例:
    0.42
  • 拓扑面积:
    66.6
  • 氢给体数:
    0
  • 氢受体数:
    6

反应信息

  • 作为反应物:
    描述:
    Perfluorobutane-1,4-disulfonic acid potassium salt 、 tris(4-tert-butylphenyl)sulfonium-trifluoromethanesulfonate salt氯仿乙醚二氯甲烷 、 material 作用下, 以 甲醇 为溶剂, 反应 17.0h, 生成 Bis(tris(4-t-butylphenyl)sulfonium) perfluorobutane-1,4-disulfonate
    参考文献:
    名称:
    Photoactive compounds
    摘要:
    本申请涉及一种A-X-B化合物,其中(i) A-X-B形成离子化合物AiXiBi,其中Ai和Bi分别为有机离子阳离子;Xi为配方Q-R500-SO3-的阴离子;或(ii) A-X-B形成非离子化合物Ac-Xc-Bc,其中Ai、Bi、Q、R500、Ac、Bc和Xc在此定义。这些化合物可用作光活性材料。
    公开号:
    US20070015084A1
  • 作为产物:
    描述:
    di(4-tertbutylphenyl)iodonium triflate 、 bis(4-tert-butylphenyl) sulfide1,2-二氯乙烷 为溶剂, 反应 12.0h, 生成 tris(4-tert-butylphenyl)sulfonium-trifluoromethanesulfonate salt
    参考文献:
    名称:
    通过芳基羟胺与芳基锍盐的 SNAr 合成功能化联芳基化合物的无过渡金属级联方法
    摘要:
    我们报告了一种无过渡金属方案,用于通过芳基羟胺到芳基锍盐的亲核芳族取代 (S N Ar) 合成功能化联芳基化合物。使用该协议,结构多样的功能化联芳基以中等至良好的产量顺利获得。这种转化的优点包括反应条件温和、底物范围广、官能团耐受性好、一锅法的可行性以及易于处理和放大。
    DOI:
    10.1021/acs.joc.2c00990
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文献信息

  • RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR
    申请人:HADA Hideo
    公开号:US20120264061A1
    公开(公告)日:2012-10-18
    A resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) including a compound represented by (b1-1), a compound represented by (b1-1′) and/or a compound represented by (b1-1″) (R 1 ″-R 3 ″ represents an aryl group or an alkyl group, provided that at least one of R 1 ″-R 3 ″ represents a substituted aryl group being substituted with a group represented by (b1-1-0), and two of R 1 ″-R 3 ″ may be mutually bonded to form a ring with the sulfur atom; X represents a C 3 -C 30 hydrocarbon group; Q 1 represents a carbonyl group-containing divalent linking group; X 10 represents a C 1 -C 30 hydrocarbon group; Q 3 represents a single bond or a divalent linking group; Y 10 represents —C(═O)— or —SO 2 —; Y 11 represents a C 1 -C 10 alkyl group or a fluorinated alkyl group: Q 2 represents a single bond or an alkylene group; and W represents a C 2 -C 10 alkylene group).
    一种抗蚀组合物,包括在酸和酸发生剂组分(B)的作用下,在碱性显影溶液中表现出改变溶解性的基础组分(A),所述酸发生剂组分(B)包括由(b1-1)表示的化合物,由(b1-1')表示的化合物和/或由(b1-1'')表示的化合物(R1''-R3''表示芳基或烷基,但至少其中一个R1''-R3''表示被(b1-1-0)表示的基团取代的取代芳基,且其中两个R1''-R3''可以相互键合以形成与硫原子形成环的环;X表示C3-C30烃基;Q1表示含有羰基的二价连接基团;X10表示C1-C30烃基;Q3表示单键或二价连接基团;Y10表示—C(═O)—或—SO2—;Y11表示C1-C10烷基或氟代烷基;Q2表示单键或烷基基团;W表示C2-C10烷基基团。
  • NOVEL COMPOUND
    申请人:UTSUMI Yoshiyuki
    公开号:US20120149916A1
    公开(公告)日:2012-06-14
    A compound represented by general formula (c1) (R 1 represents an alicyclic group of 5 or more carbon atoms which may have a substituent; X represents a divalent linking group; Y represents a linear, branched or cyclic alkylene group or an arylene group; Rf represents a hydrocarbon group containing a fluorine atom; and M + represents an organic cation or a metal cation).
    一个由一般公式表示的化合物(c1)(R1代表一个含有5个或更多碳原子的脂环基团,可能带有取代基; X代表双价连接基团; Y代表线性、支链或环烷基团或芳基团; Rf代表含有氟原子的烃基团; M+代表有机阳离子或金属阳离子)。
  • Resist composition, method of forming resist pattern, novel compound, and acid generator
    申请人:Kawaue Akiya
    公开号:US20100136478A1
    公开(公告)日:2010-06-03
    A resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including an acid generator (B1) containing a compound having a cation moiety represented by general formula (I) (in the formula, R 5 represents an organic group having a carbonyl group, an ester bond or a sulfonyl group; and Q represents a divalent linking group).
    一种抗蚀组合物,包括在酸发生剂的作用下在碱性显影溶液中表现出改变溶解度的基础组分(A)和在暴露后产生酸的酸发生剂组分(B),酸发生剂组分(B)包括含有由通式(I)表示的阳离子基团的化合物的酸发生剂(B1)(在该式中,R5代表具有羰基、酯键或磺酰基的有机基团;Q代表二价连接基团)。
  • Compositions and Methods Incorporating Photocatalysts
    申请人:Baker Ellen Schmidt
    公开号:US20090285768A1
    公开(公告)日:2009-11-19
    The various embodiments provide a composition including an active material having functional groups capable of covalent attachment to a substrate in the presence of an acid or a base, a photocatalyst capable of generating an acid or a base upon exposure to light, and a vehicle. The compositions may also include surfactants, emulsifiers, oxidants, and other components. A method for treating a substrate is also disclosed. The method includes the steps of applying at least one active material having functional groups to the substrate, applying a photocatalyst to the substrate, and exposing the photocatalyst and the at least one active material to light for forming covalent attachments between the functional groups and constituent groups on the substrate. The compositions and methods described herein are useful in personal care product and consumer care product applications, for example.
    各种实施例提供了一种组合物,包括具有在酸或碱存在下能够与基底共价结合的功能基团的活性材料,能够在光照下生成酸或碱的光催化剂,以及载体。该组合物还可以包括表面活性剂、乳化剂、氧化剂和其他组分。还公开了一种处理基底的方法。该方法包括将至少一种具有功能基团的活性材料应用于基底,将光催化剂应用于基底,并将光照射到光催化剂和至少一种活性材料,以形成功能基团与基底上的成分基团之间的共价结合。这里描述的组合物和方法在个人护理产品和消费者护理产品应用中是有用的。
  • RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20140221673A1
    公开(公告)日:2014-08-07
    A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) containing a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-0) shown below (R 1 represents a sulfur atom or an oxygen atom; R 2 represents a single bond or a divalent linking group; and Y represents an aromatic hydrocarbon group or an aliphatic hydrocarbon group having a polycyclic group, provided that the aromatic hydrocarbon group or the aliphatic hydrocarbon may have a carbon atom or a hydrogen atom thereof substituted with a substituent.
    一种抗蚀组合物,包括基础组分(A),在酸的作用下在显影溶液中表现出改变的溶解性,以及在暴露后生成酸的酸发生器组分(B),基础组分(A)包含具有下述通用式(a5-0)所示的结构单元(a5)的聚合物化合物(A1)(R1代表硫原子或氧原子;R2代表单键或二价连接基团;Y代表芳香烃基团或具有多环基团的脂肪烃基团,前提是芳香烃基团或脂肪烃基团可以有其中的碳原子或氢原子被取代的取代基)。
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