METAL MATERIAL FOR ELECTRONIC COMPONENTS, METHOD FOR PRODUCING SAME, CONNECTOR TERMINAL USING SAME, CONNECTOR AND ELECTRONIC COMPONENT
申请人:JX Nippon Mining & Metals Corporation
公开号:EP2878704A1
公开(公告)日:2015-06-03
The present invention provides metallic materials for electronic components, having low degree of whisker formation, low adhesive wear property and high durability, and connector terminals, connectors and electronic components using such metallic materials. The metallic material for electronic components includes: a base material; a lower layer formed on the base material, the lower layer being constituted with one or two or more selected from a constituent element group A, namely, the group consisting of Ni, Cr, Mn, Fe, Co and Cu; an intermediate layer formed on the lower layer, the intermediate layer being constituted with one or two or more selected from the constituent element group A and one or two selected from a constituent element group B, namely, the group consisting of Sn and In; and an upper layer formed on the intermediate layer, the upper layer being constituted with one or two selected from the constituent element group B and one or two or more selected from a constituent element group C, namely, the group consisting of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir; wherein the thickness of the lower layer is 0.05 µm or more and less than 5.00 µm; the thickness of the intermediate layer is 0.01 µm or more and less than 0.40 µm; and the thickness of the upper layer is 0.02 µm or more and less than 1.00 µm.
本发明提供了用于电子元件的
金属材料,这些材料具有低晶须形成度、低粘合磨损特性和高耐用性,以及使用此类
金属材料的连接器端子、连接器和电子元件。用于电子元件的
金属材料包括基体材料;在基体材料上形成的下层,下层由选自组成元素 A 组(即由 Ni、Cr、Mn、Fe、Co 和 Cu 组成的组)的一种或两种以上元素构成;在下层上形成的中间层,中间层由选自组成元素 A 组的一种或两种以上元素和选自组成元素 B 组(即由 Sn 和 In 组成的组)的一种或两种元素构成;在中间层上形成的上层,该上层由选自组成元素 B 组的一种或两种以及选自组成元素 C 组(即由 Ag、Au、Pt、Pd、Ru、Rh、Os 和 Ir 组成的组)的一种或两种或多种构成;其中,下层的厚度为 0.05 µm或更大,且小于5.00 µm;中间层的厚度为0.01 µm或更大,且小于0.40 µm;上层的厚度为0.02 µm或更大,且小于1.00 µm。