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5-Fluoro-2-hydroxy-3-(hydroxymethyl)benzaldehyde | 872725-47-8

中文名称
——
中文别名
——
英文名称
5-Fluoro-2-hydroxy-3-(hydroxymethyl)benzaldehyde
英文别名
5-fluoro-2-hydroxy-3-(hydroxymethyl)benzaldehyde
5-Fluoro-2-hydroxy-3-(hydroxymethyl)benzaldehyde化学式
CAS
872725-47-8
化学式
C8H7FO3
mdl
——
分子量
170.14
InChiKey
NGVGIIDXNRIPDD-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    0.6
  • 重原子数:
    12
  • 可旋转键数:
    2
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    0.12
  • 拓扑面积:
    57.5
  • 氢给体数:
    2
  • 氢受体数:
    4

文献信息

  • RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING NOVOLAC POLYMER HAVING SECONDARY AMINO GROUP
    申请人:NISSAN CHEMICAL INDUSTRIES, LTD.
    公开号:US20160326396A1
    公开(公告)日:2016-11-10
    A resist underlayer film which has an excellent hard mask function and can form an excellent pattern shape. A resist underlayer film-forming composition to be used for a lithography process, including a novolac polymer obtained by reaction of an aldehyde compound and an aromatic compound having a secondary amino group. The novolac polymer contains a unit structure of Formula (1): A method for producing a semiconductor device, including the steps of: forming a resist underlayer film from the resist underlayer film-forming composition on a semiconductor substrate; forming a hard mask on the resist underlayer film; further forming a resist film on the hard mask; forming a resist pattern by irradiation with light or an electron beam and development; etching the hard mask by using the formed resist pattern; etching the resist underlayer film by using the patterned hard mask; and processing the semiconductor substrate by using the patterned underlayer film.
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