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1-Oxy-3-propionyloxyadamantan | 63001-22-9

中文名称
——
中文别名
——
英文名称
1-Oxy-3-propionyloxyadamantan
英文别名
(3-Hydroxy-1-adamantyl) propanoate
1-Oxy-3-propionyloxyadamantan化学式
CAS
63001-22-9
化学式
C13H20O3
mdl
——
分子量
224.3
InChiKey
KWSMJJIQODSRKW-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    1.8
  • 重原子数:
    16
  • 可旋转键数:
    3
  • 环数:
    4.0
  • sp3杂化的碳原子比例:
    0.92
  • 拓扑面积:
    46.5
  • 氢给体数:
    1
  • 氢受体数:
    3

文献信息

  • Oxime sulfonates and the use thereof as latent acids
    申请人:Yamato Hitoshi
    公开号:US20100167178A1
    公开(公告)日:2010-07-01
    Compounds of the formula (I), (II) or (III), wherein R 1 is for example C 1 -C 18 alkylsulfonyl, C 1 -C 10 haloalkylsulfonyl, camphorylsulfonyl, phenyl-C 1 -C 3 alkylsulfonyl, phenylsulfonyl, naphthylsulfonyl, anthrylsulfonyl, phenanthrylsulfonyl or heteroarylsulfonyl, R′ 1 is for example phenylenedisulfonyl, R 2 is for example CN, C 1 -C 10 haloalkyl or C 1 -C 10 haloalkyl which is substituted by (IV); Ar 1 is for example phenyl optionally substituted by a group of formula (IV); Ar′ 1 is for example phenylene which optionally is substituted by a group of formula (IV); A 1 , A 2 and A 3 independently of each other are for example hydrogen, halogen, CN, or C 1 -C 18 alkyl; D 2 is for example a direct bond, O, (CO)O, (CO)S, SO 2 , OSO 2 or C 1 -C 18 alkylene; or A 3 and D 2 together form C 3 -C 30 cycloalkenyl; or A 2 and D 2 together with the carbon of the ethylenically unsaturated double bond to which they are attached form C 3 -C 30 cycloalkyl; D 3 and D 4 for example independently of each other are a direct bond, O, S, C 1 -C 18 alkylene or C 3 -C 30 cycloalkylene provided that at least one of the radicals R 2 , Ar 1 or Ar′ 1 comprises a group of the formula (IV); are suitable as photolatent acid donors and for the preparation of corresponding polymers to be employed in chemically amplified photoresists.
    化合物的公式为(I),(II)或(III),其中R1例如为C1-C18烷基磺酰基,C1-C10卤代烷基磺酰基,樟脑磺酰基,苯基-C1-C3烷基磺酰基,苯基磺酰基,基磺酰基,基磺酰基,磺酰基或杂环芳基磺酰基,R'1例如为苯基二磺酰基,R2例如为CN,C1-C10卤代烷基或被(IV)取代的C1-C10卤代烷基;Ar1例如为苯基,可选地被公式(IV)的基团取代;Ar'1例如为苯基,可选地被公式(IV)的基团取代;A1,A2和A3独立地例如为氢,卤素,CN或C1-C18烷基;D2例如为直接键,O,(CO)O,(CO)S,SO2,OSO2或C1-C18烷基;或A3和D2一起形成C3-C30环烯基;或A2和D2与它们所附着的乙烯基双键的碳一起形成C3-C30环烷基;D3和D4例如独立地为直接键,O,S,C1-C18烷基或C3-C30环烷基,至少其中之一的基团R2,Ar1或Ar'1包含公式(IV)的基团,适用作光激发酸给体,并用于制备相应的聚合物,以用于化学增强型光刻胶。
  • MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:Shin-Etsu Chemical Co., Ltd.
    公开号:EP3168207A1
    公开(公告)日:2017-05-17
    A monomer of formula (1a) or (1b) is provided wherein A is a polymerizable group, R1-R6 are monovalent hydrocarbon groups, X1 is a divalent hydrocarbon group, Z1 is an aliphatic group, Z2 forms an alicyclic group, k = 0 or 1, m = 1 or 2, n = 1 to 4. A useful polymer is obtained by polymerizing the monomer. A resist composition comprising the polymer has improved development properties and is processed to form a negative pattern having high contrast, high resolution and etch resistance which is insoluble in alkaline developer.
    提供了式 (1a) 或 (1b) 单体,其中 A 是可聚合基团,R1-R6 是一价烃基团,X1 是二价烃基团,Z1 是脂肪族基团,Z2 形成脂环族基团,k = 0 或 1,m = 1 或 2,n = 1 至 4。包含该聚合物的抗蚀剂组合物具有更好的显影性能,经处理后可形成具有高对比度、高分辨率和抗蚀刻性的阴图,且不溶于碱性显影剂。
  • COMPOUND AND CHEMICALLY AMPLIFIED RESIST COMPOSITION CONTAINING THE SAME
    申请人:Takemoto Ichiki
    公开号:US20100151379A1
    公开(公告)日:2010-06-17
    The present invention provides a compound represented by the formula (I): wherein P 1 , P 2 , P 3 , P 4 and P 5 each independently represents a hydrogen atom etc., and at least one selected from the group consisting of R 1 , R 2 , R 3 , R 4 , R 5 , R 6 , R 7 , R 8 and R 9 is the group represented by the formula (II): wherein X 1 and X 2 each independently represent a hydrogen atom etc., n represents an integer of 1 to 4, Z 1 represents a C1-C6 alkyl group etc., and ring Y represents an alicyclic hydrocarbon group, and the others each independently represent a hydrogen atom, a C1-C6 alkyl group or a hydroxyl group, and a chemically amplified resist composition containing the same.
  • COPOLYMER FOR RESIST COMPRISING NOVEL ACRYL BASED MONOMER AND RESIN COMPOSITION FOR RESIST COMPRISING THE SAME
    申请人:SHIN Jin Bong
    公开号:US20120251952A1
    公开(公告)日:2012-10-04
    A resist resin composition includes 100 parts by weight of a copolymer represented by Formula 3 below; 0.5 to 1.5 parts by weight of a photoacid generator and 700 to 1,500 parts by weight of a solvent: wherein R 1 , R 2 , and R 3 are each independently a C 1-30 alkyl group or a C 3-30 cycloalkyl group that has or does not have hydrogen, an ether group, an ester group, a carbonyl group, an acetal group, an epoxy group, a nitrile group, or an aldehyde group, R 4 , R 5 , and R 6 are each independently hydrogen or a methyl group, and l, m, n, and o each independently refer to the number of repeating units in a main backbone and satisfy the conditions: l+m+n+o=1, 0≦l/(l+m+n+o)<0.4, 0
  • US8158329B2
    申请人:——
    公开号:US8158329B2
    公开(公告)日:2012-04-17
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