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α-Propyl-undecansaeure | 804444-68-6

中文名称
——
中文别名
——
英文名称
α-Propyl-undecansaeure
英文别名
Propyl-nonyl-essigsaeure;2-Propylundecanoic acid
α-Propyl-undecansaeure化学式
CAS
804444-68-6
化学式
C14H28O2
mdl
——
分子量
228.375
InChiKey
ZDYHEEQUYCULNO-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    5.4
  • 重原子数:
    16
  • 可旋转键数:
    11
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.93
  • 拓扑面积:
    37.3
  • 氢给体数:
    1
  • 氢受体数:
    2

反应信息

点击查看最新优质反应信息

文献信息

  • ASSEMBLY AND SEMICONDUCTOR DEVICE
    申请人:Hitachi Chemical Company, Ltd.
    公开号:EP3348336A1
    公开(公告)日:2018-07-18
    Provided is a joined body including: a first member; a second member; and a sintered metal layer that joins the first member and the second member. The sintered metal layer includes a structure that is derived from flake-shaped copper particles which are oriented in approximately parallel to an interface between the first member or the second member, and the sintered metal layer, and the amount of copper contained in the sintered metal layer is 65% by volume or greater on the basis of a volume of the sintered metal layer.
    本文提供了一种连接体,包括:第一构件;第二构件;以及连接第一构件和第二构件的烧结金属层。烧结金属层包括由片状铜颗粒形成的结构,这些铜颗粒的方向大致平行于第一构件或第二构件与烧结金属层之间的界面,烧结金属层中所含的铜量占烧结金属层体积的 65% 或更多。
  • Assembly and semiconductor device
    申请人:HITACHI CHEMICAL COMPANY, LTD.
    公开号:US10566304B2
    公开(公告)日:2020-02-18
    Provided is a joined body including: a first member; a second member; and a sintered metal layer that joins the first member and the second member. The sintered metal layer includes a structure that is derived from flake-shaped copper particles which are oriented in approximately parallel to an interface between the first member or the second member, and the sintered metal layer, and the amount of copper contained in the sintered metal layer is 65% by volume or greater on the basis of a volume of the sintered metal layer.
    本文提供了一种连接体,包括:第一构件;第二构件;以及连接第一构件和第二构件的烧结金属层。烧结金属层包括由片状铜颗粒形成的结构,这些铜颗粒的方向大致平行于第一构件或第二构件与烧结金属层之间的界面,烧结金属层中所含的铜量占烧结金属层体积的 65% 或更多。
  • Copper paste for joining, method for manufacturing joined body, and method for manufacturing semiconductor device
    申请人:HITACHI CHEMICAL COMPANY, LTD.
    公开号:US10748865B2
    公开(公告)日:2020-08-18
    Provided is a copper paste for joining including copper particles, second particles including a metal element other than copper, and a dispersion medium, in which the copper particles include submicro copper particles having a volume-average particle diameter of 0.12 μm or more and 0.8 μm or less and micro copper particles having a volume-average particle diameter of 2 μm or more and 50 μm or less, a sum of a content of the submicro copper particles and a content of the micro copper particles is 80% by mass or more of a sum of masses of the copper particles and the second particles, the content of the submicro copper particles is 30% by mass or more and 90% by mass or less of a sum of a mass of the submicro copper particles and a mass of the micro copper particles, and a content of the second particles is 0.01% by mass or more and 10% by mass or less of the sum of the masses of the copper particles and the second particles.
    本发明提供了一种用于连接的铜浆,包括铜颗粒、包括铜以外的金属元素的第二颗粒和分散介质,其中铜颗粒包括体积-平均颗粒直径大于或等于 0.12 μm 且小于或等于 0.12 μm 的亚微型铜颗粒,以及体积-平均颗粒直径大于或等于 2 μm 且小于或等于 50 μm 的微型铜颗粒。8 μm 或更小的亚微米铜颗粒和体积平均颗粒直径为 2 μm 或更大且小于 50 μm 的微米铜颗粒,亚微米铜颗粒的含量和微米铜颗粒的含量之和为铜颗粒和第二颗粒质量之和的 80% 或更多,亚微米铜颗粒的含量为亚微米铜颗粒质量和微米铜颗粒质量之和的 30% 或更多且 90% 或更少,第二颗粒的含量为 0.01% (以质量计)或以上,10% (以质量计)或以下。
  • Asinger,F.; Bochnia,D., Journal fur praktische Chemie (Leipzig 1954), 1961, vol. 13, p. 1 - 22
    作者:Asinger,F.、Bochnia,D.
    DOI:——
    日期:——
  • FABRIC CARE COMPOSITIONS COMPRISING FRONT-END STABILITY AGENTS
    申请人:The Procter & Gamble Company
    公开号:EP2691503A1
    公开(公告)日:2014-02-05
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