Microstructural changes in sol-gel-derived SrxBa1−xNb2O6 (SBN) thin films were monitored as a function of Ba-to-Sr ratio (from x = 0 to x = 1), choice of substrate (Si or MgO), and processing variations. Sols were created using Ba, Sr, and Nb alkoxides dissolved in acetic acid. The relatively high decomposition temperature for the organics led to a tendency to form defects, but careful control of thermal process parameters could be used to produce a uniform film microstructure. An unexpected phase, interpreted as a hexagonal (pseudo-orthorhombic) variant of hexagonal BaNb2O6, was encountered in Ba-rich sol-gel-derived SBN powders and thin films annealed at 750 °C. Increased (001) orientation was observed for SBN thin films deposited on (100) MgO when fast thermal processing was used.
研究人员监测了溶胶-凝胶法制备的 SrxBa1-xNb2O6 (SBN) 薄膜的微观结构变化与钡-锶比率(从 x = 0 到 x = 1)、基底选择(硅或氧化镁)和加工变化的关系。溶胶是用溶解在醋酸中的钡、锶和铌烷氧基化合物制成的。有机物的分解温度相对较高,容易形成缺陷,但仔细控制热加工参数可以产生均匀的薄膜微观结构。在 750 °C 退火的富钡溶胶凝胶衍生 SBN 粉末和薄膜中,出现了一种意想不到的相,被解释为六方 BaNb2O6 的六方(假正方)变体。在使用快速热处理时,沉积在 (100) MgO 上的 SBN 薄膜的 (001) 取向增加。