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2-[4,4,4-Trifluoro-3-hydroxy-3-(trifluoromethyl)butoxymethyl]acrylic acid ethyl ester

中文名称
——
中文别名
——
英文名称
2-[4,4,4-Trifluoro-3-hydroxy-3-(trifluoromethyl)butoxymethyl]acrylic acid ethyl ester
英文别名
ethyl 2-[[4,4,4-trifluoro-3-hydroxy-3-(trifluoromethyl)butoxy]methyl]prop-2-enoate
2-[4,4,4-Trifluoro-3-hydroxy-3-(trifluoromethyl)butoxymethyl]acrylic acid ethyl ester化学式
CAS
——
化学式
C11H14F6O4
mdl
——
分子量
324.22
InChiKey
OCHWAGWZLAWYIO-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    2.5
  • 重原子数:
    21
  • 可旋转键数:
    8
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.73
  • 拓扑面积:
    55.8
  • 氢给体数:
    1
  • 氢受体数:
    10

文献信息

  • RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD AND POLYMER
    申请人:JSR CORPORATION
    公开号:US20160185999A1
    公开(公告)日:2016-06-30
    A resin composition comprises a polymer comprising a structural unit that comprises a group represented by formula (1), and a solvent. In the formula (1), R 1 to R 4 each independently represent a hydrogen atom, a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms, wherein at least one of R 1 to R 4 has the fluorine atom or a group including the fluorine atom. R 5 represents a substituted or unsubstituted trivalent chain hydrocarbon group having 1 to 7 carbon atoms. * denotes a binding site to other moiety of the structural unit. The structural unit is preferably represented by any one of formulae (2-1) to (2-3). In the formulae (2-1) to (2-3), Z represents a group represented by formula (1).
    一种树脂组合物,包括聚合物和溶剂。该聚合物包括一个结构单元,该结构单元包括由公式(1)表示的基团,其中在公式(1)中,R1至R4分别独立地表示氢原子、原子或具有1至20个碳原子的单价有机基团,其中至少有一个R1至R4包括原子或包括原子的基团。R5表示具有1至7个碳原子的取代或未取代的三价链烃基团。*表示与结构单元的其他部分结合的位点。该结构单元最好由公式(2-1)至(2-3)中的任何一个表示。在公式(2-1)至(2-3)中,Z表示由公式(1)表示的基团。
  • Cleaning composition for semiconductor substrate and cleaning method
    申请人:JSR CORPORATION
    公开号:US10023827B2
    公开(公告)日:2018-07-17
    A cleaning composition for a semiconductor substrate contains a solvent, and a polymer that includes a fluorine atom, a silicon atom or a combination thereof. The content of water in the solvent is preferably no greater than 20% by mass. The cleaning composition preferably further contains an organic acid which is a non-polymeric acid. The organic acid is preferably a polyhydric carboxylic acid. The acid dissociation constant of the polymer is preferably less than that of the organic acid. The solubility of the organic acid in water at 25° C. is preferably no less than 5% by mass. The organic acid is preferably a solid at 25° C.
    一种用于半导体基底的清洁组合物含有溶剂和聚合物,聚合物包括原子、原子或它们的组合。溶剂中的含量最好不超过 20%(质量百分比)。清洗组合物最好还含有一种非聚合酸的有机酸。有机酸最好是多氢羧酸。聚合物的酸解离常数最好小于有机酸的酸解离常数。有机酸在 25 摄氏度的中的溶解度最好不低于 5%(质量分数)。有机酸在 25 摄氏度时最好是固体。
  • Resin composition, resist pattern-forming method and polymer
    申请人:JSR CORPORATION
    公开号:US10331031B2
    公开(公告)日:2019-06-25
    A resin composition comprises a polymer comprising a structural unit that comprises a group represented by formula (1), and a solvent. In the formula (1), R1 to R4 each independently represent a hydrogen atom, a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms, wherein at least one of R1 to R4 has the fluorine atom or a group including the fluorine atom. R5 represents a substituted or unsubstituted trivalent chain hydrocarbon group having 1 to 7 carbon atoms. * denotes a binding site to other moiety of the structural unit. The structural unit is preferably represented by any one of formulae (2-1) to (2-3). In the formulae (2-1) to (2-3), Z represents a group represented by formula (1).
    一种树脂组合物包括由结构单元组成的聚合物,结构单元包括由式(1)表示的基团和溶剂。在式 (1) 中,R1 至 R4 各自独立地代表氢原子、原子或具有 1 至 20 个碳原子的单价有机基团,其中 R1 至 R4 中至少有一个具有原子或包括原子的基团。R5 代表具有 1 至 7 个碳原子的取代或未取代的三价链烃基。* 表示与结构单元其他分子的结合位点。结构单元最好由式(2-1)至(2-3)中的任意一个表示。在式(2-1)至(2-3)中,Z 代表由式(1)表示的基团。
  • Production method of composition for resist top coat layer, method of forming resist pattern, production method of fluorine-containing resin, and method of improving water repellency of resist top coat layer
    申请人:JSR CORPORATION
    公开号:US11340528B2
    公开(公告)日:2022-05-24
    Disclosed herein is a method for producing a composition for resist top coat layer, the method including: polymerizing a monomer solution containing a fluorine-containing monomer in a presence of a polymerization initiator that cleaves to generate an active species having 7 or more carbon atoms in total to obtain a fluorine-containing resin A; and mixing the fluorine-containing resin A and a solvent.
    本文公开了一种用于生产抗蚀剂面漆层组合物的方法,该方法包括:在聚合引发剂存在下,聚合含有含单体的单体溶液,聚合引发剂裂解生成总共具有 7 个或更多碳原子的活性物种,从而获得含树脂 A;以及混合含树脂 A 和溶剂。
  • COMPOSITION, RESIST PATTERN-FORMING METHOD, COMPOUND, METHOD FOR PRODUCTION OF COMPOUND, AND POLYMER
    申请人:JSR CORPORATION
    公开号:US20140248563A1
    公开(公告)日:2014-09-04
    A composition includes a polymer component including a first polymer having a first structural unit represented by a following formula (1), and a solvent. In the formula (1), R 1 represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. R 2 represents a single bond or a divalent organic group having 1 to 20 carbon atoms. R 3 represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. R Q represents a perfluoroalkyl group having 1 to 5 carbon atoms. R X represents a hydrogen atom or a monovalent base-labile group.
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