The present invention provides a chemically-amplified positive resist composition including a sulfonium salt capable of providing a pattern having an extremely high resolution with low line edge roughness, and also provides a resist patterning process using the same.
The present invention was accomplished by a chemically-amplified positive resist composition including: (A) a salt represented by the following general formula (1); and (B) a resin containing a repeating unit represented by the following general formula (U-1) that dissolves by acid action and increases solubility in an alkaline developer, and a resist patterning process using the same.
                            本发明提供了一种
化学增强型正电子光阻组合物,包括一种能够提供极高分辨率和低线边粗糙度的
磺酸盐,并提供使用该组合物的光阻图案化过程。本发明通过包括以下通式(1)所表示的盐(A)和含有通过酸作用溶解并增加在碱性显影剂中的溶解度的以下通式(U-1)所表示的重复单元的
树脂(B)的
化学增强型正电子光阻组合物实现。同时还提供使用该组合物的光阻图案化过程。