Carboxylate-Bridged Diiron(II) Complexes: Synthesis, Characterization, and O<sub>2</sub>-Reactivity of Models for the Reduced Diiron Centers in Methane Monooxygenase and Ribonucleotide Reductase
作者:Susanna Herold、Stephen J. Lippard
DOI:10.1021/ja9628563
日期:1997.1.1
Diiron(II) complexes with an oxygen-rich coordination environment were assembled with the dinucleating dicarboxylate ligands m-xylylenediamine bis(Kemp's triacid)imide (H2XDK) and the more soluble analogue m-xylylenediamine bis(propyl Kemp's triacid)imide (H2PXDK). X-ray crystallographic analysis revealed that, in most of the complexes, only one monodentate N-donor ligand is bound to each iron(II)
具有富氧配位环境的二铁 (II) 配合物与双核二羧酸配体间苯二甲胺双(坎普三酸)亚胺(H2XDK)和更易溶解的类似物间苯二甲胺双(丙基坎普三酸)亚胺(H2PXDK)组装在一起。X 射线晶体学分析表明,在大多数配合物中,只有一个单齿 N 供体配体与每个铁 (II) 离子结合。除了 XDK 和 PXDK 之外,还有多种其他配体桥接双金属核,包括氯化物、氟化物、三氟甲磺酸盐或羧酸盐。三(羧酸盐桥接)配合物 [Fe2(μ-XDK)(μ-O2CPh)(ImH)2(O2CPh)(MeOH)] (3) 和 [Fe2(μ-O2CC(CH3)3)(μ-PXDK )(N-MeIm)2(O2CC(CH3)3)] (4) 与甲烷单加氧酶 (MMO) 的羟化酶成分和核糖核苷酸还原酶 (RNR) 的 R2 蛋白中的二铁 (II) 核心具有相同的配体组成)。3和4中两个铁中心的配位环境是不等价的,一个铁是6配位的,另一个是4配位的。桥
POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS
申请人:NISHI Tsunehiro
公开号:US20100062374A1
公开(公告)日:2010-03-11
A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid and (B) an acid generator. The resin (A) is a polymer comprising recurring units containing a non-leaving hydroxyl group represented by formula (1) wherein R
1
is H, methyl or trifluoromethyl, X is a single bond or methylene, m is 1 or 2, and the hydroxyl group attaches to a secondary carbon atom. The composition is improved in resolution when processed by lithography.
NOVEL PHOTOACID GENERATOR, RESIST COMPOSITION, AND PATTERNING PROCESS
申请人:Ohsawa Youichi
公开号:US20090246694A1
公开(公告)日:2009-10-01
Photoacid generators generate sulfonic acids of formula (
1
a) upon exposure to high-energy radiation.
ROC(═O)R
1
—COOCH
2
CF
2
SO
3
−
H
+
(1a)
RO is OH or C
1
-C
20
organoxy, R
1
is a divalent C
1
-C
20
aliphatic group or forms a cyclic structure with RO. The photoacid generators are compatible with resins and can control acid diffusion and are thus suited for use in chemically amplified resist compositions.
POLYMERIZABLE ANION-CONTAINING SULFONIUM SALT AND POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS
申请人:Ohashi Masaki
公开号:US20100055608A1
公开(公告)日:2010-03-04
A polymerizable anion-containing sulfonium salt having formula (1) is provided wherein R
1
is H, F, methyl or trifluoromethyl, R
2
, R
3
and R
4
are C
1
-C
10
alkyl, alkenyl or oxoalkyl or C
6
-C
18
aryl, aralkyl or aryloxoalkyl, or two of R
2
, R
3
and R
4
may bond together to form a ring with S, A is a C
1
-C
10
organic group, and n is 0 or 1. The sulfonium salt generates a very strong sulfonic acid upon exposure to high-energy radiation. A resist composition comprising a polymer derived from the sulfonium salt is also provided.
NOVEL PHOTOACID GENERATOR, RESIST COMPOSITION, AND PATTERNING PROCESS
申请人:OHASHI Masaki
公开号:US20090061358A1
公开(公告)日:2009-03-05
Photoacid generators generate sulfonic acids of formula (1a) or (1c) upon exposure to high-energy radiation.
R
1
—COOCH(CF
3
)CF
2
SO
3
+
H
+
(1a)
R
1
—O—COOCH(CF
3
)CF
2
SO
3
−
H
+
(1c)
R
1
is a C
20
-C
50
hydrocarbon group having a steroid structure. The photoacid generators are compatible with resins and can control acid diffusion and are thus suited for use in chemically amplified resist compositions.