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Methyl-acetoxyacetoxyacetat | 29747-04-4

中文名称
——
中文别名
——
英文名称
Methyl-acetoxyacetoxyacetat
英文别名
(2-Methoxy-2-oxoethyl) 2-acetyloxyacetate;(2-methoxy-2-oxoethyl) 2-acetyloxyacetate
Methyl-acetoxyacetoxyacetat化学式
CAS
29747-04-4
化学式
C7H10O6
mdl
——
分子量
190.153
InChiKey
XSCDQHUYLLWRFJ-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    0
  • 重原子数:
    13
  • 可旋转键数:
    7
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.57
  • 拓扑面积:
    78.9
  • 氢给体数:
    0
  • 氢受体数:
    6

文献信息

  • Pattern forming method, composition kit and resist film, manufacturing method of electronic device using these, and electronic device
    申请人:FUJIFILM Corporation
    公开号:US10031419B2
    公开(公告)日:2018-07-24
    There is provided a pattern forming method comprising (i) forming a film on a substrate using an actinic ray-sensitive or radiation-sensitive resin composition which contains (A) a resin which decomposes due to an action of an acid to change its solubility with respect to a developer and (C) a specific resin, (ii) forming a top coat layer using a top coat composition which contains a resin (T) on the film, (iii) exposing the film which has the top coat layer to actinic rays or radiation, and (iv) forming a pattern by developing the film which has the top coat layer after the exposing.
    本发明提供了一种图案形成方法,包括(i)使用感光树脂组合物或辐射敏感树脂组合物在基底上形成胶片,该组合物包含(A)由于酸的作用而分解,从而改变其相对于显影剂的溶解度的树脂和(C)特定树脂、(ii) 使用含有树脂 (T) 的表层组合物在胶片上形成表层,(iii) 将具有表层的胶片暴露于放 射线或辐射,(iv) 在暴露后对具有表层的胶片进行显影,形成图案。
  • ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM AND METHOD OF FORMING PATTERN
    申请人:FUJIFILM CORPORATION
    公开号:US20140227636A1
    公开(公告)日:2014-08-14
    Provided is an actinic-ray- or radiation-sensitive resin composition including a resin (Aa) containing at least one repeating unit (Aa1) derived from monomers of general formula (aa1-1) below and at least one repeating unit (Aa2) derived from monomers of general formula (aa2-1) below and comprising a resin (Ab) that when acted on by an acid, changes its alkali solubility.
  • PATTERN FORMING METHOD, COMPOSITION KIT AND RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THESE, AND ELECTRONIC DEVICE
    申请人:FUJIFILM Corporation
    公开号:US20160048075A1
    公开(公告)日:2016-02-18
    There is provided a pattern forming method comprising (i) forming a film on a substrate using an actinic ray-sensitive or radiation-sensitive resin composition which contains (A) a resin which decomposes due to an action of an acid to change its solubility with respect to a developer and (C) a specific resin, (ii) forming a top coat layer using a top coat composition which contains a resin (T) on the film, (iii) exposing the film which has the top coat layer to actinic rays or radiation, and (iv) forming a pattern by developing the film which has the top coat layer after the exposing.
  • ORGANIC THIN FILM TRANSISTOR, METHOD OF MANUFACTURING ORGANIC THIN FILM TRANSISTOR, ORGANIC SEMICONDUCTOR COMPOSITION, ORGANIC SEMICONDUCTOR FILM, AND METHOD OF MANUFACTURING ORGANIC SEMICONDUCTOR FILM
    申请人:FUJIFILM Corporation
    公开号:US20180175299A1
    公开(公告)日:2018-06-21
    An object of the present invention is to provide an organic thin film transistor exhibiting high carrier mobility and a low threshold voltage and having excellent heat resistance, a method of manufacturing an organic thin film transistor, an organic semiconductor composition, an organic semiconductor film, and a method of manufacturing an organic semiconductor film. The organic thin film transistor according to the present invention includes, on a substrate, a gate electrode; an organic semiconductor layer containing an organic semiconductor compound; a gate insulating layer provided between the gate electrode and the organic semiconductor layer; and a source electrode and a drain electrode which are provided to be in contact with the organic semiconductor layer and are linked to each other via the organic semiconductor layer, in which the organic semiconductor layer is in contact with a layer containing a resin (C) or further contains the resin (C), and in which the organic semiconductor compound has a molecular weight of 2,000 or greater and has a repeating unit represented by Formula (1). D-A  (1)
  • US9323150B2
    申请人:——
    公开号:US9323150B2
    公开(公告)日:2016-04-26
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