Substitutional carbon reduction in SiGeC alloys grown by rapid thermal chemical vapor deposition
作者:C. W. Liu、Y. D. Tseng、Y. S. Huang
DOI:10.1063/1.124987
日期:1999.10.11
The substitutionalcarbonreduction in Si1−x−yGexCy strained layers, annealed at high temperatures, increases the compressive strain in the originally strain-compensated alloys. From the rocking curve simulation, the maximum amount of carbonreduction was below 0.9% for the various samples which were annealed below 1000 °C in the nitrogen flow. The interstitial silicon injection by thermal oxidation
Si1-x-yGexCy 应变层中的置换碳还原,在高温下退火,增加了原始应变补偿合金的压缩应变。根据摇摆曲线模拟,在氮气流中在 1000 °C 以下退火的各种样品的最大碳减少量低于 0.9%。通过 Si1-x-yGexCy 层上的 Si 帽热氧化进行的填隙硅注入增强了置换碳的减少至 1.3% 的浓度。Si1-x-yGexCy 合金的氧化产生富含 Ge 的 Si1-xGex 层,其 Ge 浓度大于初始含量,并且通过傅里叶变换红外光谱观察到 3C 碳化硅沉淀的形成。
Reactions of boranes and carboranes with silanes, organosilanes, and related compounds
作者:Will A. Ledoux、Russell N. Grimes
DOI:10.1016/s0022-328x(00)81572-7
日期:1971.4
Gas-phase thermal and electric discharge interactions of SiH4, Si2H6, and (CH3)2SiH2 with B4H10, B5H9, and 2,3-C2B4H8 were studied, as well as the reactions of (CH3)2GeH2 and (CH3)2SnH2 with 2,3-C2B4H8. In addition, several silyl-substituted derivatives of 2,3-C2B4H8 were prepared from silylacetylenes and boron hydrides, and their conversion to closo-carborane silyl derivatives was examined. All silylcarboranes
研究了SiH 4,Si 2 H 6和(CH 3)2 SiH 2与B 4 H 10,B 5 H 9和2,3-C 2 B 4 H 8的气相热和放电相互作用,以及(CH 3)2 GeH 2和(CH 3)2 SnH 2与2,3-C 2 B 4 H 8的反应。此外,2,3-C的几种甲硅烷基取代的衍生物2乙4 ħ 8从silylacetylenes和硼氢化合物制备,和它们转化成闭合碳检查-carborane甲硅烷基衍生物。所获得的所有甲硅烷基碳烷均经C取代,在任何研究的反应中均未获得含有SiB键的挥发性产物。获得了GeC 2 B 5 H 7多面体笼系统的甲基衍生物的证据。
[EN] PROCESS FOR THE STEPWISE SYNTHESIS OF SILAHYDROCARBONS<br/>[FR] PROCÉDÉ DE SYNTHÈSE SÉQUENTIELLE DE SILAHYDROCARBURES
申请人:MOMENTIVE PERFORMANCE MAT INC
公开号:WO2021243137A1
公开(公告)日:2021-12-02
The invention relates to a process for the stepwise synthesis of silahydrocarbons bearing up to four different organyl substituents at the silicon atom, wherein the process includes at least one step a) of producing a bifunctional hydridochlorosilane by a redistribution reaction, selective chlorination of hydridosilanes with an ether/HCI reagent, or by selective chlorination of hydridosilanes with SiCI4, at least one step b) of submitting a bifunctional hydridochloromonosilane to a hydrosilylation reaction, at least one step c) of hydrogenation of a chloromonosilane, and a step d) in which a silahydrocarbon compound is obtained in a hydrosilylation reaction.
本发明涉及一种逐步合成在硅原子上带有最多四种不同有机基团取代的硅氢化物的过程,其中该过程包括至少以下步骤:a) 通过重分配反应、使用醚/HCI试剂对氢硅烷进行选择性氯化,或者通过使用四氯化硅对氢硅烷进行选择性氯化来制备双功能氢氯硅烷;至少一个步骤 b) 将双功能氢氯单硅烷进行氢硅化反应;至少一个步骤 c) 对氯代单硅烷进行氢化;以及步骤 d) 在氢硅化反应中获得硅氢化物化合物。
Process For Preparing Si-H-Containing Silanes
申请人:Geisberger Gilbert
公开号:US20080319214A1
公开(公告)日:2008-12-25
Silanes of the general formula (1)
R
a
SiH
b
X
4-b-a
(1)
are prepared by disproportionating at least one more highly chlorinated silane in the presence of a homogeneous catalyst in an apparatus with at least one reactive distillation column and at least one additional reactor selected from among prereactors and side reactors, where
R is an alkyl, aryl, alkaryl or haloalkyl radical,
X is a halogen atom,
a is 0 or 1, and
b is 2, 3 or 4.
通式(1)
R
a
SiH
b
X
4-b-a
(1)
的硅烷通过在至少一个高氯化硅烷存在的情况下,在至少一个具有至少一个反应蒸馏柱和至少一个选自预反应器和侧反应器的附加反应器的装置中,通过不均等反应制备,其中
R是烷基、芳基、烷芳基或卤代烷基基团,
X是卤素原子,
a为0或1,且
b为2、3或4。
Defect‐free band‐edge photoluminescence and band gap measurement of pseudomorphic Si<sub>1−<i>x</i>−<i>y</i></sub>Ge<sub><i>x</i></sub>C<sub><i>y</i></sub> alloy layers on Si (100)
作者:A. St. Amour、C. W. Liu、J. C. Sturm、Y. Lacroix、M. L. W. Thewalt
DOI:10.1063/1.115316
日期:1995.12.25
strain is reduced more efficiently than the bandgap is increased. Furthermore, results imply that a fully strain‐compensated Si1−x−yGexCy layer on Si (100) would have a bandgap much less than that of Si, and suggest that initial C incorporation reduces the bandgap of relaxed, unstrained Si1−x−yGexCy alloys.
已经实现了在 Si (100) 上具有带边光致发光且无缺陷相关发光的伪晶 Si1-x-yGexCy 合金层。光致发光在 2 到 77 K 范围内测量,并用于直接测量带隙位移作为添加 C 时应变减少的函数。与仅降低 Ge 含量的效果相比,结果表明,随着 C 的加入,应变的降低比带隙的增加更有效。此外,结果表明,Si (100) 上完全应变补偿的 Si1-x-yGexCy 层的带隙将远小于 Si,并表明初始 C 掺入降低了松弛、未应变的 Si1-x 的带隙-yGexCy 合金。