Anionically polymerizable monomers containing at least one silicon or titanium atom form polymeric photoresists having good dry etch resistance for use in microlithography. The monomers are of the formula ##STR1## wherein A is --H or --CH.dbd.CH.sub.2 ; X is a strong electron withdrawing group; Y is a strong electron withdrawing group containing at least one silicon or titanium atom. Preferably Y is ##STR2## wherein n is 1-5 and R.sup.2, R.sup.3 and R.sup.4 are C.sub.1 -C.sub.10 alkyl. A particularly preferred monomer is 3-trimethylsilylpropyl 2-cyanoacrylate. Methods for applying a resist coating by vapor deposition of these monomers and exposure to radiation are described. A positive or negative tone image can be produced, depending upon the imaging method employed. The imaging layer may be applied over a planarizing layer to form a multilayer photoresist.
含有至少一个
硅或
钛原子的阴离子聚合单体形成具有良好干法蚀刻抗性的聚合光阻,用于微影技术。这些单体的
化学式为##STR1##其中A是--H或--CH.dbd.CH.sub.2; X是强电子提取基团; Y是含有至少一个
硅或
钛原子的强电子提取基团。优选的Y是##STR2##其中n为1-5,R.sup.2、R.sup.3和R.sup.4为C.sub.1-C.sub.10烷基。一种特别优选的单体是3-三甲基
硅基丙基
2-氰基丙烯酸酯。描述了通过蒸汽沉积这些单体并暴露于辐射下应用光阻涂层的方法。根据所采用的成像方法,可以产生正向或负向图像。成像层可以涂覆在平坦化层上以形成多层光阻。