申请人:Shire International Licensing B.V.
公开号:EP1852695A1
公开(公告)日:2007-11-07
An assay for analytically determining the amount of an impurity in a solid sample is provided. This X-ray diffraction method preferably uses the Rietveld refinement.
提供了一种分析测定固体样品中杂质含量的方法。这种 X 射线衍射方法最好使用里特维尔德精炼法。