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4-[8,14,20-Tris(4-carboxyphenyl)-4,6,10,12,16,18,22,24-octahydroxy-2-pentacyclo[19.3.1.13,7.19,13.115,19]octacosa-1(25),3(28),4,6,9(27),10,12,15,17,19(26),21,23-dodecaenyl]benzoic acid | 118600-32-1

中文名称
——
中文别名
——
英文名称
4-[8,14,20-Tris(4-carboxyphenyl)-4,6,10,12,16,18,22,24-octahydroxy-2-pentacyclo[19.3.1.13,7.19,13.115,19]octacosa-1(25),3(28),4,6,9(27),10,12,15,17,19(26),21,23-dodecaenyl]benzoic acid
英文别名
——
4-[8,14,20-Tris(4-carboxyphenyl)-4,6,10,12,16,18,22,24-octahydroxy-2-pentacyclo[19.3.1.13,7.19,13.115,19]octacosa-1(25),3(28),4,6,9(27),10,12,15,17,19(26),21,23-dodecaenyl]benzoic acid化学式
CAS
118600-32-1;118712-53-1;1176080-09-3
化学式
C56H40O16
mdl
——
分子量
968.924
InChiKey
ZOQPTAWSIFAGAH-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    8.8
  • 重原子数:
    72
  • 可旋转键数:
    8
  • 环数:
    9.0
  • sp3杂化的碳原子比例:
    0.07
  • 拓扑面积:
    311
  • 氢给体数:
    12
  • 氢受体数:
    16

反应信息

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文献信息

  • CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION
    申请人:Shibata Mitsuru
    公开号:US20100190107A1
    公开(公告)日:2010-07-29
    A cyclic compound shown by the following formula (I):
    一个由以下公式(I)所示的环状化合物:
  • Host-guest complexation. 48. Octol building blocks for cavitands and carcerands
    作者:Linda M. Tunstad、John A. Tucker、Enrico Dalcanale、Jurgen Weiser、Judi A. Bryant、John C. Sherman、Roger C. Helgeson、Carolyn B. Knobler、Donald J. Cram
    DOI:10.1021/jo00267a015
    日期:1989.3
  • TUNSTAD, LINDA M.;TUCKER, JOHN A.;DALCANALE, ENRICO;WEISER, JURGEN;BRYANT+, J. ORG. CHEM., 54,(1989) N, C. 1305-1312
    作者:TUNSTAD, LINDA M.、TUCKER, JOHN A.、DALCANALE, ENRICO、WEISER, JURGEN、BRYANT+
    DOI:——
    日期:——
  • RADIATION-SENSITIVE COMPOSITION
    申请人:Echigo Masatoshi
    公开号:US20100047709A1
    公开(公告)日:2010-02-25
    A radiation-sensitive composition containing a resist compound having a high sensitivity, a high resolution, a high etching resistance, and a low outgas which forms a resist pattern with a good shape is described. Further described is a method of forming a resist pattern using the radiation-sensitive composition. Still further described are a novel composition for forming a photoresist under coat film which is excellent in optical properties and etching resistance and contains substantially no sublimable substance and an under coat film formed by the composition. Still further described are a radiation-sensitive composition containing a solvent and a cyclic compound having a specific structure, for example, a cyclic compound (A) having a molecular weight of 700 to 5000 which is synthesized by the condensation reaction of a compound having 2 to 59 carbon atoms and 1 to 4 formyl groups (aldehyde compound (A1)) with a compound having 6 to 15 carbon atoms and 1 to 3 phenolic hydroxyl groups (phenol compound (A2)), and a cyclic compound for use in the radiation-sensitive composition.
  • US8110334B2
    申请人:——
    公开号:US8110334B2
    公开(公告)日:2012-02-07
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