Polymer compound, negative resist composition, and method of forming resist pattern
申请人:Tokyo Ohka Kogyo Co., Ltd.
公开号:US07820360B2
公开(公告)日:2010-10-26
There are provided a polymer compound which can form a resist pattern with excellent resolution, and a negative resist composition containing the polymer compound and a resist pattern-forming method thereof.
The present invention is a polymer compound containing a structural unit (a0) represented by a general formula (a0-1) shown below.
(wherein, R represents a hydrogen atom, a halogen atom, an alkyl group or a halogenated alkyl group; and R0 represents an alkyl group containing a hydroxyl group.)
Also, the present invention is a negative resist composition, including: an alkali soluble resin component (A), an acid generator component (B) that generates acid upon exposure, and a cross-linking agent (C), wherein the alkali soluble resin component (A) contains a polymer compound (A1) having a structural unit (a0) represented by the general formula (a0-1) shown above.
提供了一种聚合物化合物,可以形成具有优异分辨率的抗蚀图案,以及包含该聚合物化合物的负性抗蚀组合物和其抗蚀图案形成方法。本发明是一种聚合物化合物,包含下面所示的一般式(a0-1)表示的结构单元(a0)。(其中,R代表氢原子、卤原子、烷基或卤代烷基;R0代表含有羟基的烷基。)此外,本发明是一种负性抗蚀组合物,包括:可溶于碱性树脂组分(A)、在曝光后产生酸的酸发生剂组分(B)和交联剂(C),其中碱性可溶树脂组分(A)包含具有由上述一般式(a0-1)表示的结构单元(a0)的聚合物化合物(A1)。