Synthesis and Fundamental Studies of (H<sub>3</sub>Ge)<i><sub>x</sub></i>SiH<sub>4</sub><sub>-</sub><i><sub>x</sub></i> Molecules: Precursors to Semiconductor Hetero- and Nanostructures on Si
作者:Cole J. Ritter、Changwu Hu、Andrew V. G. Chizmeshya、John Tolle、Douglas Klewer、Ignatius S. T. Tsong、John Kouvetakis
DOI:10.1021/ja051411o
日期:2005.7.13
epitaxial layers and coherent islands (quantum dots), with Ge-rich stoichiometries SiGe, SiGe(2), SiGe(3), and SiGe(4) reflecting the Si/Ge content of the corresponding precursor. The layers grow directly on Si(100) at unprecedented lowtemperatures of 300-450 degrees C and display homogeneous compositional and strain profiles, low threading defect densities, and atomically planar surfaces circumventing entirely
Cl<i><sub>n</sub></i>H<sub>6-</sub><i><sub>n</sub></i>SiGe Compounds for CMOS Compatible Semiconductor Applications: Synthesis and Fundamental Studies
作者:Jesse B. Tice、Andrew V. G. Chizmeshya、Radek Roucka、John Tolle、Brian R. Cherry、John Kouvetakis
DOI:10.1021/ja0713680
日期:2007.6.1
derivatives such as Cl2SiHGeH2Cl (3), Cl2SiHGeHCl2 (4), ClSiH2GeH2Cl (5), and ClSiH2GeHCl2 (6) have also been produced for the first time leading to a newclass of highlyreactive Si-Ge compounds that are of fundamental and practical interest. Compounds 1-6 are characterized by physical and spectroscopic methods including NMR, FTIR, and mass spectroscopy. The results combined with first principles density