作者:F. Richardeau、P. Baudesson、T. Meynard、C. Turpin                                    
                                    
                                        DOI:10.1051/epjap:2001182
                                    
                                    
                                        日期:2001.9
                                    
                                    The aim of this paper is to explain the intrinsic fail-safe capability of a high-voltage IGBT inverter source. The inverter is an imbricated cells structure which provides redundancy. The major failures can be either a wrong gate voltage (malfunctioning of the driver board, auxiliary power supply failure, dv/dt disturbance) or an intrinsic IGBT failure (over-voltage/avalanche stress, temperature overshoot). The IGBT failures are studied and show that no opening of the bondings can appear and consequently no risk of explosion. Owing to the imbricated cells structure, an IGBT failure can be withstand a few switching periods, with nevertheless non-optimized output waveforms. The design and the lab-test of a sensor able to perform monitoring and failure diagnosis are also presented. This real-time diagnosis allows either a safety stop or a remedial control strategy based on the reconfiguration of the control signals. The real-time reconfiguration allows to decrease internal stresses and to optimize the shape of the output voltage. In this case, a fail-safe operating may be gained for high power applications.
                                    本文旨在解释高压IGBT逆变器源的内在安全故障能力。该逆变器采用重叠单元结构,提供了冗余性。主要故障可能是错误的栅极电压(驱动板故障、辅助电源故障、dv/dt干扰)或IGBT的内在故障(过电压/雪崩应力、温度超标)。对IGBT故障进行了研究,结果显示没有任何连接开路,因此没有爆炸风险。由于重叠单元结构,IGBT故障可以承受几个开关周期,尽管输出波形未经过优化。还介绍了一种能够进行监测和故障诊断的传感器的设计及实验室测试。这种实时诊断可以实现安全停机或基于控制信号重配置的补救控制策略。实时重配置能够减小内部应力并优化输出电压的形状。在这种情况下,对于高功率应用,可以实现安全故障运行。