Building Addressable Libraries: The Use of a Mass Spectrometry Cleavable Linker for Monitoring Reactions on a Microelectrode Array
作者:Ceng Chen、Gabriella Nagy、Amy V. Walker、Karl Maurer、Andy McShea、Kevin D. Moeller
DOI:10.1021/ja067194o
日期:2006.12.1
Time-of-flight secondary ion mass spectrometry (TOF SIMS) has been used in conjunction with a mass spectrometry cleavable linker to determine the percent conversion of reactions that were conducted site-selectively on an addressable microelectrode array. When combined with fluorescence techniques for analysis of the reactions, the TOF SIMS experiment provides a means for optimization of both reaction
飞行时间二次离子质谱 (TOF SIMS) 已与质谱可裂解连接器结合使用,以确定在可寻址微电极阵列上进行位点选择性反应的转化百分比。当结合荧光技术分析反应时,TOF SIMS 实验提供了一种优化微电极阵列上的反应限制和反应效率的方法。