Monitoring devices and processes based on transformation, destruction and conversion of nanostructures
申请人:Patel Gordhanbhai Nathalal
公开号:US20110003279A1
公开(公告)日:2011-01-06
A large number of properties of nanostructures depend on their size, shape and many other parameters. As the size of a nanostructure decreases, there is a rapid change in many properties. When the nanostructure is completely destroyed, those properties essentially disappear. Systems based on changes in properties of nanostructures due to the destruction of nanostructures are proposed. The systems can be used for monitoring the total exposure to organic, inorganic, organometallic and biological compounds and agents using analytical methods.