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2-Hydroxy-4-oxo-4-(triphenyl-lambda4-sulfanyl)oxybutanoic acid

中文名称
——
中文别名
——
英文名称
2-Hydroxy-4-oxo-4-(triphenyl-lambda4-sulfanyl)oxybutanoic acid
英文别名
2-hydroxy-4-oxo-4-(triphenyl-λ4-sulfanyl)oxybutanoic acid
2-Hydroxy-4-oxo-4-(triphenyl-lambda4-sulfanyl)oxybutanoic acid化学式
CAS
——
化学式
C22H20O5S
mdl
——
分子量
396.5
InChiKey
JEPAGMBAIGBQNU-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    4.5
  • 重原子数:
    28
  • 可旋转键数:
    8
  • 环数:
    3.0
  • sp3杂化的碳原子比例:
    0.09
  • 拓扑面积:
    84.8
  • 氢给体数:
    2
  • 氢受体数:
    6

文献信息

  • METHOD FOR FORMING PATTERN, AND POLYSILOXANE COMPOSITION
    申请人:JSR Corporation
    公开号:US20150048046A1
    公开(公告)日:2015-02-19
    A pattern-forming method in which processibility of a silicon-containing film in etching with a fluorine gas and resistance against etching with an oxygen gas can be together improved in a multilayer resist process to form a finer pattern. Provided is a pattern-forming method that includes the steps of (1) providing a silicon-containing film on the upper face side of a substrate to be processed using a polysiloxane composition; (2) forming a resist pattern on the silicon-containing film; (3) dry-etching the silicon-containing film using the resist pattern as a mask to form a silicon-containing pattern; and (4) dry-etching the substrate to be processed using the silicon-containing pattern as a mask to form a pattern, in which the polysiloxane composition includes (A) a polysiloxane containing a fluorine atom, and (B) a crosslinking accelerator.
  • US9434609B2
    申请人:——
    公开号:US9434609B2
    公开(公告)日:2016-09-06
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