Influence du taux de dopant sur la resistance de polarisation a l'electrode O2, Ag/(CeO2)1−x(CaO)x
作者:K. El Adham、A. Hammou
DOI:10.1016/0025-5408(86)90203-5
日期:1986.2
Abstract The main purpose of the present work is to show the influence of the dopant content in the electrode polarization resistance. Measurements were carried out on the O 2 , Ag/(CeO 2 ) 1−x (CaO) x electrode between 520 and 680°C, using impedance spectroscopy method. x ranges between 4.7610 −2 to 14.810 −2 . All samples have fluorine structure and are ionic conductors in pure oxygen. Results have
摘要 本工作的主要目的是展示掺杂剂含量对电极极化电阻的影响。使用阻抗光谱法在 520 至 680°C 之间对 O 2 、Ag/(CeO 2 ) 1-x (CaO) x 电极进行测量。x 的范围在 4.7610 -2 到 14.810 -2 之间。所有样品都具有氟结构并且是纯氧中的离子导体。结果表明存在电极极化电阻的倒数的最大值。该最大值大致对应于与体电导率的组成相同的组成。然而,电极过程的活化能更高(1,8eV)。