A problem of the present invention is to provide an organic thin film transistor insulating layer material which is capable of forming a cross-linked structure without conducting a treatment at higher temperature, and which enables an organic thin film transistor to have a small absolute value of threshold voltage (Vth) when it is used for the formation of a gate insulating layer. The means for solving the problem is an organic thin film transistor insulating layer material including a macromolecular compound that has a repeating unit having a group containing a fluorine atom and a repeating unit having a photodimerization-reactive group. Preferred examples of the group containing a fluorine atom include an aryl group in which a hydrogen atom has been substituted with a fluorine atom and an alkylaryl group in which a hydrogen atom has been substituted with a fluorine atom, and particularly a phenyl group in which a hydrogen atom has been substituted with a fluorine atom and an alkylphenyl group in which a hydrogen atom has been substituted with a fluorine atom. Preferred examples of the photodimerization-reactive group include an aryl groups in which a hydrogen atom has been substituted with a halomethyl group, and particularly a phenyl group in which a hydrogen atom has been substituted with a halomethyl group.
本发明的一个问题是提供一种有机薄膜晶体管绝缘层材料,该材料能够在不进行高温处理的情况下形成交联结构,并使有机薄膜晶体管在用于形成栅极绝缘层时具有较小的阈值电压(Vth)绝对值。解决该问题的方法是一种有机薄膜晶体管绝缘层材料,包括一种大分子化合物,其
重复单元具有一个含
氟原子的基团和一个具有光二聚化反应基团的
重复单元。含
氟原子基团的优选实例包括
氢原子被
氟原子取代的芳基和
氢原子被
氟原子取代的烷芳基,特别是
氢原子被
氟原子取代的
苯基和
氢原子被
氟原子取代的烷基
苯基。光二聚化反应基团的优选实例包括
氢原子被卤代
甲基取代的芳基,特别是
氢原子被卤代
甲基取代的
苯基。