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Octyl (bicyclo[2.2.1]hept-5-en-2-yl)acetate | 92773-36-9

中文名称
——
中文别名
——
英文名称
Octyl (bicyclo[2.2.1]hept-5-en-2-yl)acetate
英文别名
octyl 2-(2-bicyclo[2.2.1]hept-5-enyl)acetate
Octyl (bicyclo[2.2.1]hept-5-en-2-yl)acetate化学式
CAS
92773-36-9
化学式
C17H28O2
mdl
——
分子量
264.4
InChiKey
OAPCPNHIXKPKNU-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    5.3
  • 重原子数:
    19
  • 可旋转键数:
    10
  • 环数:
    2.0
  • sp3杂化的碳原子比例:
    0.82
  • 拓扑面积:
    26.3
  • 氢给体数:
    0
  • 氢受体数:
    2

文献信息

  • RESIN MATERIAL FOR FORMING UNDERLAYER FILM, RESIST UNDERLAYER FILM, METHOD FOR PRODUCING RESIST UNDERLAYER FILM, AND LAYERED PRODUCT
    申请人:Mitsui Chemicals, Inc.
    公开号:EP3693793A1
    公开(公告)日:2020-08-12
    Provided is a resin material for forming an underlayer film which is used to form a resist underlayer film used in a multi-layer resist process, the resin material including a cyclic olefin polymer (I), in which a temperature at an intersection between a storage modulus (G') curve and a loss modulus (G") curve in a solid viscoelasticity of the resin material for forming an underlayer film which is as measured under conditions of a measurement temperature range of 30°C to 300°C, a heating rate of 3°C/min, and a frequency of 1 Hz in a nitrogen atmosphere in a shear mode using a rheometer is higher than or equal to 40°C and lower than or equal to 200°.
    本发明提供了一种用于形成底层膜的树脂材料,该底层膜可用于形成多层光刻胶工艺中使用的光刻胶底层膜,该树脂材料包括环烯烃聚合物 (I)、其中,用于形成底层膜的树脂材料的固体粘弹性中的存储模量(G')曲线和损失模量(G")曲线的交点温度高于或等于 40°C,且低于或等于 200°C;该固体粘弹性是在测量温度范围为 30°C 至 300°C、加热速率为 3°C/min 和频率为 1 Hz 的条件下,在氮气环境中使用流变仪以剪切模式测得的。
  • RESIN MATERIAL FOR FORMING UNDERLAYER FILM, RESIST UNDERLAYER FILM, METHOD OF PRODUCING RESIST UNDERLAYER FILM, AND LAMINATE
    申请人:MITSUI CHEMICALS, INC.
    公开号:US20200241419A1
    公开(公告)日:2020-07-30
    Provided is a resin material for forming an underlayer film which is used to form a resist underlayer film used in a multi-layer resist process, the resin material including a cyclic olefin polymer (I), in which a temperature at an intersection between a storage modulus (G′) curve and a loss modulus (G″) curve in a solid viscoelasticity of the resin material for forming an underlayer film which is as measured under conditions of a measurement temperature range of 30° C. to 300° C., a heating rate of 3° C./min, and a frequency of 1 Hz in a nitrogen atmosphere in a shear mode using a rheometer is higher than or equal to 40° C. and lower than or equal to 200°.
  • MATERIAL FOR FORMING UNDERLAYER FILM, RESIST UNDERLAYER FILM, METHOD OF PRODUCING RESIST UNDERLAYER FILM, AND LAMINATE
    申请人:MITSUI CHEMICALS, INC.
    公开号:US20200264511A1
    公开(公告)日:2020-08-20
    A material for forming an underlayer film according to the present invention is a material for forming an underlayer film which is used to form a resist underlayer film used in a multi-layer resist process, the material including a cyclic olefin polymer which has a repeating structural unit [A] represented by Formula (1) and a repeating structural unit [B] represented by Formula (2), in which a molar ratio [A]/[B] of the structural unit [A] to the structural unit [B] in the cyclic olefin polymer is greater than or equal to 5/95 and less than or equal to 95/5.
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