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(Oxolan-2-yl)methyl 2-methylbutanoate | 1881965-98-5

中文名称
——
中文别名
——
英文名称
(Oxolan-2-yl)methyl 2-methylbutanoate
英文别名
oxolan-2-ylmethyl 2-methylbutanoate
(Oxolan-2-yl)methyl 2-methylbutanoate化学式
CAS
1881965-98-5
化学式
C10H18O3
mdl
——
分子量
186.25
InChiKey
IVFCTOQBFINRSN-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    1.9
  • 重原子数:
    13
  • 可旋转键数:
    5
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    0.9
  • 拓扑面积:
    35.5
  • 氢给体数:
    0
  • 氢受体数:
    3

文献信息

  • COPOLYMER FOR SEMICONDUCTOR LITHOGRAPHY AND PROCESS FOR PRODUCING THE SAME
    申请人:Yamagishi Takanori
    公开号:US20090306328A1
    公开(公告)日:2009-12-10
    To provide a copolymer for semiconductor lithography employed for forming a resist film as well as thin films such as an anti-reflection film, a gap-filling film, a top coating film, etc. which are formed on or under a resist film, these films being employed in semiconductor lithography, wherein the copolymer has excellent solubility in a solution of a thin film-forming composition and prevents generation of microparticles (e.g., microgel) and pattern defects, and to provide a method for producing the copolymer reliably on an industrial scale. The invention is directed to a copolymer for semiconductor lithography having at least one repeating unit selected from among (A) a repeating unit having a hydroxyl group; (B) a repeating unit having a structure in which a hydroxyl group is protected by a group which inhibits dissolution in an alkaline developer and which dissociates by the action of an acid; (C) a repeating unit having a lactone structure; and (D) a repeating unit having a cyclic ether structure, wherein, when a solution of the copolymer in propylene glycol monomethyl ether acetate having a viscosity of 15 mPa·sec is caused to pass through a filter having a pore size of 0.03 μm under a pressure difference of 0.1 MPa for 60 minutes, the solution exhibits an average flow rate per unit filter area of 200 g/min/m 2 or more, and to a method for producing the copolymer.
  • METHOD FOR PRODUCING A COPOLYMER SOLUTION WITH A UNIFORM CONCENTRATION FOR SEMICONDUCTOR LITHOGRAPHY
    申请人:YAMAGISHI Takanori
    公开号:US20100143842A1
    公开(公告)日:2010-06-10
    A method of producing a copolymer solution for semiconductor lithography having a copolymer and a solvent for coating film formation, which copolymer contains at least one repeating unit selected from the group consisting of: a repeating unit (A) having a hydroxyl group; a repeating unit (B) having a structure in which a hydroxyl group is protected by a group which suppresses dissolution into an alkaline developer and which dissociates in the action of an acid; a repeating unit (C) having a lactone structure; and a repeating unit (D) having a cyclic ether structure, the difference in the copolymer concentration among a plurality of containers which were filled with copolymer solution from the same manufacturing lot is not more than a certain range, or the method includes a certain production step.
  • PHOTOSENSITIVE COMPOSITION, IMAGE FORMING METHOD, FILM FORMING METHOD, RESIN, IMAGE, AND FILM
    申请人:FUJIFILM CORPORATION
    公开号:US20180162979A1
    公开(公告)日:2018-06-14
    Provided are a photosensitive composition containing a resin which includes a structural unit A represented by Formula (1) or (2) and a structural unit B represented by Formula (3), (4), or (5); and a radically polymerizable monomer, an image forming method, a film forming method, a resin, an image, and a film. R 11 , R 21 , R 31 , R 41 , and R 51 represent H or a hydrocarbon group, R 12 to R 14 and R 22 to R 24 represent a hydrocarbon group, H, or an OH group, R 42 , R 43 , R 52 , and R 53 represent H or a hydrocarbon group, L 1 to L 3 represent a single bond or a linking group, X 1 represents —O— or —NR 15 —, X 2 represent —O— or —NR 25 —, R 15 and R 25 represent H or a hydrocarbon group, and Cy 1 represents a hydrocarbon group which may contain O and has a cyclic structure.
  • US7960494B2
    申请人:——
    公开号:US7960494B2
    公开(公告)日:2011-06-14
  • US8377625B2
    申请人:——
    公开号:US8377625B2
    公开(公告)日:2013-02-19
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