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2-(1-adamantanecarbonyloxy)-1,1,3,3,3-pentafluoropropane-sulfonate | 911785-49-4

中文名称
——
中文别名
——
英文名称
2-(1-adamantanecarbonyloxy)-1,1,3,3,3-pentafluoropropane-sulfonate
英文别名
2-(Adamantane-1-carbonyloxy)-1,1,3,3,3-pentafluoropropane-1-sulfonic acid
2-(1-adamantanecarbonyloxy)-1,1,3,3,3-pentafluoropropane-sulfonate化学式
CAS
911785-49-4
化学式
C14H17F5O5S
mdl
——
分子量
392.344
InChiKey
YDOPMIAANRCTID-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    3.5
  • 重原子数:
    25
  • 可旋转键数:
    5
  • 环数:
    4.0
  • sp3杂化的碳原子比例:
    0.93
  • 拓扑面积:
    89
  • 氢给体数:
    1
  • 氢受体数:
    10

文献信息

  • MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:SHIN-ETSU CHEMICAL CO., LTD.
    公开号:US20150322027A1
    公开(公告)日:2015-11-12
    A monomer (1) is prepared by reacting a compound (9) with a base or metal to form a metal enolate reagent, and reacting the metal enolate reagent with an acyloxyketone compound (8). A polymer derived from the monomer is used as base resin to formulate a resist composition, which is shelf stable and displays a high dissolution contrast, controlled acid diffusion and low roughness in forming positive pattern via alkaline development and in forming negative pattern via organic solvent development.
    一种单体(1)是通过将一种化合物(9)与碱或属反应形成属烯醇盐试剂,然后将属烯醇盐试剂与一种酰氧基酮化合物(8)反应而制备的。由该单体派生出的聚合物用作基础树脂,以配制一种光刻胶组合物,该组合物在常温下稳定,显示出高溶解对比度、控制的酸性扩散和在碱性显影形成正图案以及有机溶剂显影形成负图案时低粗糙度。
  • NITROGEN-CONTAINING ORGANIC COMPOUND, CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:SAGEHASHI Masayoshi
    公开号:US20120052441A1
    公开(公告)日:2012-03-01
    An aralkylcarbamate of imidazole base is effective as the quencher. In a chemically amplified positive resist composition comprising the carbamate, deprotection reaction of carbamate takes place by reacting with the acid generated upon exposure to high-energy radiation, whereby the composition changes its basicity before and after exposure, resulting in a pattern profile with advantages including high resolution, rectangular shape, and minimized dark-bright difference.
    咪唑基团的芳烷基碳酸酯作为猝灭剂是有效的。在包含该碳酸酯的化学放大正性光刻胶组合物中,碳酸酯的去保护反应是通过与在暴露于高能辐射时产生的酸反应来实现的,通过这种方式,组合物在曝光前后改变其碱性,从而得到具有高分辨率、矩形形状和最小化暗亮差异等优点的图案轮廓。
  • ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:Shin-Etsu Chemical Co., Ltd.
    公开号:US20200223796A1
    公开(公告)日:2020-07-16
    A novel onium salt of formula (1) and a chemically amplified resist composition comprising the same as a PAG are provided. When processed by photolithography using KrF or ArF excimer laser, EB or EUV, the resist composition has a high sensitivity and reduced acid diffusion and is improved in exposure latitude, MEF, and LWR.
    提供了一种化学增感剂组合物,其中包括式(1)的新型离子盐作为PAG。当使用KrF或ArF准分子激光、EB或EUV进行光刻工艺处理时,该抗蚀组合物具有高灵敏度、减少酸扩散,并在曝光宽度、MEF和LWR方面得到改善。
  • Resist composition and patterning process
    申请人:Watanabe Satoshi
    公开号:US20100009299A1
    公开(公告)日:2010-01-14
    The present invention relates to: a resist composition such as a chemically amplified resist composition for providing an excellent pattern profile even at a substrate-side boundary face of resist, in addition to a higher resolution in photolithography for micro-fabrication, and particularly in photolithography adopting, as an exposure source, KrF laser, ArF laser, F 2 laser, ultra-short ultraviolet light, electron beam, X-rays, or the like; and a patterning process utilizing the resist composition. The present invention provides a chemically amplified resist composition comprising one or more kinds of amine compounds or amine oxide compounds (except for those having a nitrogen atom of amine or amine oxide included in a ring structure of an aromatic ring) at least having a carboxyl group and having no hydrogen atoms covalently bonded to a nitrogen atom as a basic center.
    本发明涉及一种抗蚀组合物,例如用于在抗蚀物的基板侧边界面上提供优异图案轮廓的化学增感抗蚀组合物,除了在微细加工的光刻工艺中具有更高的分辨率外,特别是在采用KrF激光、ArF激光、F2激光、超短紫外光、电子束、X射线等作为曝光光源的光刻工艺中;以及利用该抗蚀组合物的图案化工艺。本发明提供一种化学增感抗蚀组合物,其包括一种或多种胺化合物或胺氧化合物(除了那些在芳香环的环结构中不含有胺或胺氧原子的氮原子的化合物),至少具有一个羧基,并且没有氢原子共价键结合到氮原子作为碱性中心。
  • POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS
    申请人:NISHI Tsunehiro
    公开号:US20100062374A1
    公开(公告)日:2010-03-11
    A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid and (B) an acid generator. The resin (A) is a polymer comprising recurring units containing a non-leaving hydroxyl group represented by formula (1) wherein R 1 is H, methyl or trifluoromethyl, X is a single bond or methylene, m is 1 or 2, and the hydroxyl group attaches to a secondary carbon atom. The composition is improved in resolution when processed by lithography.
    一种正性光刻胶组合物包括(A)在酸的作用下在碱性显影剂中变得可溶的树脂组分和(B)酸发生剂。树脂(A)是一种聚合物,包含由式(1)表示的非离去羟基的重复单元,其中R1为H、甲基或三甲基,X为单键或亚甲基,m为1或2,并且羟基连接到次级碳原子。当通过光刻工艺处理时,该组合物在分辨率方面得到改善。
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