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[3-[2-(2-Methylbutan-2-yloxy)-2-oxoethoxy]-1-adamantyl] 2,2-dimethylbutanoate

中文名称
——
中文别名
——
英文名称
[3-[2-(2-Methylbutan-2-yloxy)-2-oxoethoxy]-1-adamantyl] 2,2-dimethylbutanoate
英文别名
[3-[2-(2-methylbutan-2-yloxy)-2-oxoethoxy]-1-adamantyl] 2,2-dimethylbutanoate
[3-[2-(2-Methylbutan-2-yloxy)-2-oxoethoxy]-1-adamantyl] 2,2-dimethylbutanoate化学式
CAS
——
化学式
C23H38O5
mdl
——
分子量
394.5
InChiKey
SFNCUNHBXUATLK-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    5.1
  • 重原子数:
    28
  • 可旋转键数:
    10
  • 环数:
    4.0
  • sp3杂化的碳原子比例:
    0.91
  • 拓扑面积:
    61.8
  • 氢给体数:
    0
  • 氢受体数:
    5

文献信息

  • RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND COMPOUND
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20140178821A1
    公开(公告)日:2014-06-26
    A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, including a base component (A) which exhibits changed solubility in a developing solution under action of acid, and a photo-decomposable quencher (D0) containing a compound represented by general formula (d0) shown below. In the formula, R 1 represents a hydrocarbon group of 4 to 20 carbon atoms which may have a substituent; Y 1 represents a single bond or a divalent linking group; R 2 and R 3 each independently represents a substituent of 0 to 20 carbon atoms other than a fluorine atom; one of R 2 and R 3 may form a ring with Y 1 ; M m+ represents an organic cation having a valency of m; and m represents an integer of 1 or more.
  • RESIST COMPOSITION, COMPOUND, POLYMERIC COMPOUND AND METHOD OF FORMING RESIST PATTERN
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20140356787A1
    公开(公告)日:2014-12-04
    A resist composition comprising a compound (m0) (wherein Rb 1 represents an electron withdrawing group; Rb 2 and Rb 3 each independently represents an aryl group, an alkyl group or an alkenyl group, provided that Rb 2 and Rb 3 may be mutually bonded to form a ring with the sulfur atom; and X0 − represents a monovalent counteranion).
  • RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20140363772A1
    公开(公告)日:2014-12-11
    A resist composition including a high-molecular weight compound having a constituent unit represented by general formula (a0-1), a constituent unit (a1) containing a group containing a monocyclic group or a chain group among acid decomposable groups whose polarity increases by action of acid, a constituent unit (a1′) containing a group containing a polycyclic group among acid decomposable groups whose polarity increases by the action of an acid, and a constituent unit (a2) containing a lactone-containing monocyclic group, with a proportion of the constituent unit (a1) being equal to a proportion of the constituent unit (a1′) or more; and a method for forming a resist pattern using the resist composition.
  • RESIST COMPOSITION, ACID GENERATOR, POLYMERIC COMPOUND AND METHOD OF FORMING RESIST PATTERN
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20150037734A1
    公开(公告)日:2015-02-05
    A resist composition containing a compound represented by general formula (m0), wherein R 1 and R 2 each independently represents an aryl group which may have a substituent, an alkyl group which may have a substituent, or an alkenyl group which may have a substituent, provided that R 1 and R 2 may be mutually bonded to form a ring with the sulfur atom; R 3 represents an aromatic hydrocarbon group which may have a substituent, an alkenyl group which may have a substituent, or an alkynyl group which may have a substituent; V 1 represents a single bond or an alkylene group, provided that, when R 3 is an aromatic hydrocarbon group which may have a substituent, V 1 is an alkylene group; and X0 − represents a monovalent organic anion.
  • RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND, COMPOUND
    申请人:Tokyo Ohka Kogyo Co., Ltd.
    公开号:US20150140497A1
    公开(公告)日:2015-05-21
    A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, and which includes a base component (A) which exhibits changed solubility in a developing solution under action of acid, the base component (A) including a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-0) shown below (wherein V 11 represents an aliphatic cyclic group with or without a substituent; R 1 represents a lactam-containing cyclic group or a sultam-containing cyclic group; Y 1 represents an oxygen atom (—O—), an ester bond (—C(═O)—O—) or a single bond; and W 2 represents a group formed by a polymerization reaction of a polymerizable group-containing group).
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