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1-[(4-Ethyl-2-methyl-9-tetracyclo[7.3.1.02,7.06,11]tridecanyl)oxy]ethyl 2,2-dimethylbutanoate

中文名称
——
中文别名
——
英文名称
1-[(4-Ethyl-2-methyl-9-tetracyclo[7.3.1.02,7.06,11]tridecanyl)oxy]ethyl 2,2-dimethylbutanoate
英文别名
1-[(4-ethyl-2-methyl-9-tetracyclo[7.3.1.02,7.06,11]tridecanyl)oxy]ethyl 2,2-dimethylbutanoate
1-[(4-Ethyl-2-methyl-9-tetracyclo[7.3.1.02,7.06,11]tridecanyl)oxy]ethyl 2,2-dimethylbutanoate化学式
CAS
——
化学式
C24H40O3
mdl
——
分子量
376.6
InChiKey
HVLLDQMQRCUGAD-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    6.9
  • 重原子数:
    27
  • 可旋转键数:
    7
  • 环数:
    5.0
  • sp3杂化的碳原子比例:
    0.96
  • 拓扑面积:
    35.5
  • 氢给体数:
    0
  • 氢受体数:
    3

文献信息

  • PATTERN-FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THEM AND ELECTRONIC DEVICE
    申请人:Fujifilm Corporation
    公开号:US20140193749A1
    公开(公告)日:2014-07-10
    A pattern-forming method includes in this order: step (1) of forming a film with an electron beam-sensitive or extreme ultraviolet radiation-sensitive resin composition that contains (A) a resin having an acid-decomposable repeating unit and capable of decreasing a solubility of the resin (A) in a developer containing an organic solvent by an action of an acid, (B) a compound capable of generating an acid upon irradiation with an electron beam or extreme ultraviolet radiation and (C) a solvent; step (2) of exposing the film with an electron beam or extreme ultraviolet radiation; and step (4) of forming a negative pattern by development of the film with a developer containing an organic solvent after the exposing of the film, wherein a content of the compound (B) is 21% by mass to 70% by mass on the basis of all solids content of the composition.
  • US9170489B2
    申请人:——
    公开号:US9170489B2
    公开(公告)日:2015-10-27
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