Electron diffraction investigation of the molecular structure of cyclopropyl silane
作者:Marwan Dakkouri、Volker Typke
DOI:10.1016/0022-2860(87)80029-7
日期:1987.5
Abstract The molecular structure of cyclopropyl silane (CPS) has been determined by gas phase electron diffraction. Among other parameters the bond distances (ra) are: C1C2 = 1.528(2) A, C2C3 = 1.490(4) A, SiC = 1.840(2) A, CH = 1.095(3) A. The angle between the ring plane and the bond SiC is 55.9(3)°. The introduction of a tilt of the silyl group is in agreement with the secondary effect of substituents
摘要 环丙基硅烷(CPS)的分子结构已通过气相电子衍射确定。在其他参数中,键距 (ra) 是: C1C2 = 1.528(2) A, C2C3 = 1.490(4) A, SiC = 1.840(2) A, CH = 1.095(3) A . 环平面与键SiC的夹角为55.9(3)°。引入倾斜的甲硅烷基与取代基的次级效应一致。讨论了硅 3d 轨道在解释 CPS 结构数据中的作用。我们的结果支持根据 dπ 共轭对 SiC 键与硅的解释。这导致环结构的不对称。(pd)π 键合概念被认为是三种不同贡献的总和:离子、空间和 dπ 共轭。