申请人:FUJI PHOTO FILM CO., LTD.
公开号:US20030090653A1
公开(公告)日:2003-05-15
The surface defect inspection method and apparatus are capable of inspecting a photosensitive material for defective surface portions with efficiency by using a reflex-type optical sensor. The surface defect inspection apparatus has a reflex-type optical sensor. A thermal-developable photosensitive material is irradiated with inspection light from a light source. Reflected light from the photosensitive material is received by a light-receiving portion of the optical sensor and a defective surface portion is detected from the reflected light. A mask is attached to the light-receiving portion to cut out specular reflected light, thereby enabling a change in the quantity of diffuse reflected light to be directly detected. Therefore, even a defective surface portion where only a small diffuse reflectance is recognized can be detected with efficiency.
表面缺陷检测方法和设备能够通过使用反射式光学传感器,高效地检测光敏材料表面的缺陷部分。表面缺陷检测设备具有一个反射式光学传感器。用来自光源的检测光照射热显影光敏材料。光学传感器的光接收部分接收来自光敏材料的反射光,并从反射光中检测出缺陷表面部分。光接收部分上有一个遮罩,用于遮挡镜面反射光,从而可以直接检测到漫反射光量的变化。因此,即使只识别到很小的漫反射光的缺陷表面部分,也能有效地检测出来。