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[双-(2-羟基-乙基)-氨基]- 乙腈 | 86241-19-2

中文名称
[双-(2-羟基-乙基)-氨基]- 乙腈
中文别名
[双-(2-羟基-乙基)-氨基]-乙腈
英文名称
2-(bis(2-hydroxyethyl)amino)acetonitrile
英文别名
N,N-bis-(2-hydroxy-ethyl)-glycine nitrile;[Bis-(2-hydroxy-aethyl)-amino]-essigsaeure-nitril;[Bis-(2-hydroxy-aethyl)-amino]-acetonitril;N,N-Bis-(2-hydroxy-aethyl)-glycin-nitril;N,N-bis(2-hydroxyethyl)aminoacetonitrile;[Bis-(2-hydroxy-ethyl)-amino]-acetonitrile;2-[bis(2-hydroxyethyl)amino]acetonitrile
[双-(2-羟基-乙基)-氨基]- 乙腈化学式
CAS
86241-19-2
化学式
C6H12N2O2
mdl
——
分子量
144.173
InChiKey
WYTYJSOEBBLPAE-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    -1.3
  • 重原子数:
    10
  • 可旋转键数:
    5
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.83
  • 拓扑面积:
    67.5
  • 氢给体数:
    2
  • 氢受体数:
    4

安全信息

  • 海关编码:
    2926909090

SDS

SDS:c37af03fb0cda24d7cd6c353143c6817
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上下游信息

  • 下游产品
    中文名称 英文名称 CAS号 化学式 分子量

反应信息

  • 作为反应物:
    描述:
    [双-(2-羟基-乙基)-氨基]- 乙腈 在 lithium aluminium tetrahydride 、 氯化亚砜 作用下, 以 四氢呋喃 为溶剂, 反应 1.5h, 生成 9-N(N'-bis-chloroethyl-N'-1,2-diamino ethyl) 2-methoxy acridine dihydrochloride
    参考文献:
    名称:
    Synthesis and DNA-sequence selectivity of a series of mono- and difunctional 9-aminoacridine nitrogen mustards
    摘要:
    The aim of this work was to identify nitrogen mustards that would react selectively with DNA, particularly in G-rich regions. A sei ies of mono- and difunctional nitrogen mustards was synthesized in which the (2-chloroethyl)amino functions were connected to the N-9 of 9-aminoacridine by way of a spacer chain consisting of two to six methylene units. The length of the spacer chain connecting the alkylating and putative DNA-intercalating groups was found to affect the preference for the alkylation of different guanine-N-7 positions in a DNA sequence. All of the compounds reacted preferentially at G's that are followed by G as do most other types of nitrogen mustards, but the degree of selectivity was greater. The compounds reacted at much lower concentrations than were required for comparable reaction by mechlorethamine (HN2), consistent with initial noncovalent binding to DNA prior to guanine-N-7 alkylation. The degree of DNA-sequence selectivity increased as the spacer-chain length decreased below four methylene units. Most strikingly, long spacer compounds reacted strongly at 5'-GT-3' sequences, Whereas this reaction was almost completely suppressed when-the spacer length was reduced to two or three methylenes. Mono- and difunctional compounds of a given spacer length showed no consistent difference in DNA-sequence preference.
    DOI:
    10.1021/jm00027a008
  • 作为产物:
    描述:
    二乙醇胺溴乙腈三乙胺 作用下, 以 甲醇二氯甲烷 为溶剂, 以96%的产率得到[双-(2-羟基-乙基)-氨基]- 乙腈
    参考文献:
    名称:
    Intermediates for the production of diethanolamine
    摘要:
    根据反应方案,生产二乙醇胺衍生物或其酸盐的方法:##STR1## 其中X代表一个离去基团;R.sup.1代表一个烷基氨基甲酰基团,提供了一种工业上有利的制备该主题物质的方法,可用作抗心律失常药物。
    公开号:
    US05210271A1
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文献信息

  • Novel sulfonyldiazomethanes, photoacid generators, resist compositions, and patterning process
    申请人:——
    公开号:US20040167322A1
    公开(公告)日:2004-08-26
    A chemical amplification type resist composition comprising a specific benzenesulfonyldiazomethane containing a long-chain alkoxyl group at the 2-position on benzene ring has many advantages including improved resolution, improved focus latitude, minimized line width variation or shape degradation even on long-term PED, minimized debris left after coating, development and peeling, and improved pattern profile after development and is thus suited for microfabrication.
    一种化学放大型抗蚀组合物,包括在苯环上的2-位含有长链烷氧基基团的特定苯磺酰二氮甲烷,具有许多优点,包括提高分辨率,改善焦点宽度,即使在长期PED上也减少线宽变化或形状退化,涂层、显影和剥离后减少残留物,并在显影后改善图案轮廓,因此适用于微加工。
  • Photoacid generators, chemically amplified resist compositions, and patterning process
    申请人:Ohsawa Youichi
    公开号:US20070292768A1
    公开(公告)日:2007-12-20
    A photoacid generator has formula (1). A chemically amplified resist composition comprising the photoacid generator has advantages including a high resolution, focus latitude, long-term PED dimensional stability, and a satisfactory pattern profile shape. When the photoacid generator is combined with a resin having acid labile groups other than those of the acetal type, resolution and top loss are improved. The composition is suited for deep UV lithography.
    一种光酸发生剂的化学式为(1)。包括该光酸发生剂的化学增感抗蚀组合物具有诸如高分辨率、焦点宽度、长期PED尺寸稳定性和令人满意的图案轮廓形状等优点。当该光酸发生剂与具有除了缩醛类型以外的酸敏感基团的树脂结合时,可以改善分辨率和顶部损失。该组合物适用于深紫外光刻。
  • Resist composition and patterning process
    申请人:Watanabe Satoshi
    公开号:US20100009299A1
    公开(公告)日:2010-01-14
    The present invention relates to: a resist composition such as a chemically amplified resist composition for providing an excellent pattern profile even at a substrate-side boundary face of resist, in addition to a higher resolution in photolithography for micro-fabrication, and particularly in photolithography adopting, as an exposure source, KrF laser, ArF laser, F 2 laser, ultra-short ultraviolet light, electron beam, X-rays, or the like; and a patterning process utilizing the resist composition. The present invention provides a chemically amplified resist composition comprising one or more kinds of amine compounds or amine oxide compounds (except for those having a nitrogen atom of amine or amine oxide included in a ring structure of an aromatic ring) at least having a carboxyl group and having no hydrogen atoms covalently bonded to a nitrogen atom as a basic center.
    本发明涉及一种抗蚀组合物,例如用于在抗蚀物的基板侧边界面上提供优异图案轮廓的化学增感抗蚀组合物,除了在微细加工的光刻工艺中具有更高的分辨率外,特别是在采用KrF激光、ArF激光、F2激光、超短紫外光、电子束、X射线等作为曝光光源的光刻工艺中;以及利用该抗蚀组合物的图案化工艺。本发明提供一种化学增感抗蚀组合物,其包括一种或多种胺化合物或胺氧化合物(除了那些在芳香环的环结构中不含有胺或胺氧原子的氮原子的化合物),至少具有一个羧基,并且没有氢原子共价键结合到氮原子作为碱性中心。
  • POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS
    申请人:NISHI Tsunehiro
    公开号:US20100062374A1
    公开(公告)日:2010-03-11
    A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid and (B) an acid generator. The resin (A) is a polymer comprising recurring units containing a non-leaving hydroxyl group represented by formula (1) wherein R 1 is H, methyl or trifluoromethyl, X is a single bond or methylene, m is 1 or 2, and the hydroxyl group attaches to a secondary carbon atom. The composition is improved in resolution when processed by lithography.
    一种正性光刻胶组合物包括(A)在酸的作用下在碱性显影剂中变得可溶的树脂组分和(B)酸发生剂。树脂(A)是一种聚合物,包含由式(1)表示的非离去羟基的重复单元,其中R1为H、甲基或三氟甲基,X为单键或亚甲基,m为1或2,并且羟基连接到次级碳原子。当通过光刻工艺处理时,该组合物在分辨率方面得到改善。
  • NOVEL PHOTOACID GENERATOR, RESIST COMPOSITION, AND PATTERNING PROCESS
    申请人:Ohsawa Youichi
    公开号:US20090246694A1
    公开(公告)日:2009-10-01
    Photoacid generators generate sulfonic acids of formula ( 1 a) upon exposure to high-energy radiation. ROC(═O)R 1 —COOCH 2 CF 2 SO 3 − H + (1a) RO is OH or C 1 -C 20 organoxy, R 1 is a divalent C 1 -C 20 aliphatic group or forms a cyclic structure with RO. The photoacid generators are compatible with resins and can control acid diffusion and are thus suited for use in chemically amplified resist compositions.
    光酸发生剂在高能辐射作用下生成式(1a)的磺酸。 ROC(═O)R1—COOCH2CF2SO3−H+(1a) RO为OH或C1-C20有机氧基,R1为二价的C1-C20脂肪族基团或与RO形成环状结构。这些光酸发生剂与树脂相容,可以控制酸的扩散,因此适用于化学增感抗蚀组合物的使用。
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