申请人:General Electric Company
公开号:US20020135758A1
公开(公告)日:2002-09-26
The present invention provides a method for quantifying structural defects of a coating composition on a given substrate, where certain structural defect-inducing tests are performed. In this method, a coating formulation is doped with a colorimetric or luminescent material. Concentration of the material depends on the quantum efficiency, excitation and emission wavelengths, and employed detection techniques, and can range from about 1 fM to about 1 mM. Before, during and/or after such tests, the coating is illuminated with a wavelength of radiation at which the reflected or transmitted color or emitted luminescence of the material in the coating is detectable with an optical detector or by visual inspection. In this fashion, the percentage of failure of the coating can be quantified as well as the level of interdiffusion of coating into substrate or substrate into coating. The method of the invention is thus particularly well-suited for the combinatorial analysis of an array of coating samples. Additionally, when the structural defect-inducing material test is being performed, the removed coating material can be analyzed in like fashion.
本发明提供了一种量化涂层组合物在给定基底上的结构缺陷的方法,其中要进行某些结构缺陷诱发试验。在该方法中,涂层配方掺入了比色或发光材料。材料的浓度取决于量子效率、激发和发射波长以及所采用的检测技术,范围从约 1 fM 到约 1 mM。在测试前、测试中和/或测试后,用一定波长的辐射照射涂层,在此波长下,涂层中材料的反射或透射颜色或发射的发光可以用光学检测器或目测检测到。通过这种方式,可以量化涂层失效的百分比以及涂层与基底或基底与涂层之间的相互扩散程度。因此,本发明的方法特别适用于涂层样品阵列的组合分析。此外,在进行结构缺陷诱导材料测试时,还可以对去除的涂层材料进行类似的分析。