A system provides non-invasive stoichiometric detection and imaging of chemical elements and compounds in a material to be analyzed. The system includes a particle generator which generates first and second particles at a target position a first distance from the material. The system further comprises a photon detector capable of detecting photons resulting from irradiation of the material by the first particles and generating a plurality of first electrical signals. The system further comprises a particle detector array for detecting the second partices at a second distance, larger than the first distance, from the target position and generating a plurality of second electrical signals. The system further comprises an analyzer comprising a processor that produces a plurality of filtered electrical signals. The analyzer further comprises a plurality of electronic coincidence circuits which detect coincidences occurring between the plurality of filtered electrical signals and the plurality of second electrical signals.
一种系统可对待分析材料中的
化学元素和化合物进行非侵入式
化学计量检测和成像。该系统包括一个粒子发生器,可在距离材料第一距离的目标位置产生第一和第二粒子。该系统还包括一个光子探测器,能够检测第一粒子照射材料产生的光子,并产生多个第一电信号。该系统还包括一个粒子探测器阵列,用于在距离目标位置大于第一距离的第二距离处检测第二粒子,并产生多个第二电信号。系统还包括一个分析仪,该分析仪包含一个处理器,可产生多个滤波电信号。分析仪还包括多个电子重合电路,用于检测多个滤波电信号和多个第二电信号之间发生的重合。