PHOTOACID GENERATOR, METHOD FOR PRODUCING THE SAME, AND RESIST COMPOSITION COMPRISING THE SAME
申请人:OH Jung Hoon
公开号:US20120203024A1
公开(公告)日:2012-08-09
A photoacid generator represented by the following formula (1), a method for producing the photoacid generator, and a resist composition containing the photoacid generator are provided.
wherein in the formula (1), Y
1
, Y
2
, X, R
1
, R
2
, n
1
, n
2
and A
+
have the same meanings as defined in the detailed description of the invention. The photoacid generator can maintain an appropriate contact angle at the time of ArF liquid immersion lithography, can reduce defects occurring during liquid immersion lithography, and has excellent solubility in resist solvents and excellent compatibility with resins. Furthermore, the photoacid generator can be produced by an efficient and simple method using an epoxy compound that is industrially easily available.
提供以下公式(1)所代表的光酸发生剂、生产光酸发生剂的方法以及含有光酸发生剂的抗蚀组合物。在公式(1)中,Y1、Y2、X、R1、R2、n1、n2和A+的含义与发明详细说明中定义的含义相同。该光酸发生剂可以在ArF液体浸没光刻时保持适当的接触角,可以减少液体浸没光刻过程中发生的缺陷,并且在抗蚀溶剂中具有优异的溶解性和与树脂的优异兼容性。此外,该光酸发生剂可以通过使用工业上易获得的环氧化合物进行高效简单的生产方法制备。