5,10,15,20-tetrakis(4-methylphenyl)porphyrin

• 分子结构分类: 有机化合物 - 有机杂环化合物 - 四吡咯及其衍生物
• 英文名称: 5,10,15,20-tetrakis(4-methylphenyl)porphyrin
• 化学式: C₄₈H₃₆N₄
• 分子量: 668.8
• InChiKey: VWODZMSWQYEWBW-UHFFFAOYSA-N

计算性质

• 辛醇/水分配系数(LogP)：
  11.1
• 重原子数：
  52
• 可旋转键数：
  4
• 环数：
  9.0
• sp3杂化的碳原子比例：
  0.08
• 拓扑面积：
  49.4
• 氢给体数：
  0
• 氢受体数：
  4

文献信息

• RESIN COMPOSITION, LAMINATE, RESIN COMPOSITION LAYER-ATTACHED SEMICONDUCTOR WAFER, SUBSTRATE FOR MOUNTING RESIN COMPOSITION LAYER-ATTACHED SEMICONDUCTOR, AND SEMICONDUCTOR DEVICE
  申请人：MITSUBISHI GAS CHEMICAL COMPANY, INC.

  公开号：EP3786200A1

  公开（公告）日：2021-03-03

  A resin composition that has excellent flux activity, flexibility and storage stability and that is suitable for a pre-applied underfill material is provided. The resin composition of the present invention contains a compound (A) having a phenolic hydroxy group, a metal ion trapping agent (B) and a radical polymerizable compound (C).

  本发明提供了一种树脂组合物，该树脂组合物具有优异的通量活性、柔韧性和贮存稳定性，适用于预涂敷的底部填充材料。本发明的树脂组合物含有一种具有酚羟基的化合物（A）、一种金属离子捕获剂（B）和一种可自由基聚合的化合物（C）。
• IN-LINE COATING WEIGHT AND RADIANT ENERGY EXPOSURE MEASUREMENT
  申请人：Sun Chemical Corporation

  公开号：EP3568689A1

  公开（公告）日：2019-11-20
• RESIN COMPOSITION, LAMINATE, SEMICONDUCTOR WAFER WITH RESIN COMPOSITION LAYER, SUBSTRATE FOR MOUNTING SEMICONDUCTOR WITH RESIN COMPOSITION LAYER AND SEMICONDUCTOR DEVICE
  申请人：MITSUBISHI GAS CHEMICAL COMPANY, INC.

  公开号：US20210277221A1

  公开（公告）日：2021-09-09

  A resin composition that has excellent flux activity, flexibility and storage stability and that is suitable for a pre-applied underfill material is provided. The resin composition contains a compound (A) having a phenolic hydroxy group, a metal ion trapping agent (B) and a radical polymerizable compound (C).
• US5103027A
  申请人：——

  公开号：US5103027A

  公开（公告）日：1992-04-07
• [EN] IN-LINE COATING WEIGHT AND RADIANT ENERGY EXPOSURE MEASUREMENT<br/>[FR] MESURE EN-LIGNE DE POIDS DE REVÊTEMENT ET D'EXPOSITION À UNE ÉNERGIE RAYONNANTE
  申请人：SUN CHEMICAL CORP

  公开号：WO2018132361A1

  公开（公告）日：2018-07-19

  A method for measuring the radiant exposure of energy curable inks or coatings on a printing press. The steps for measuring comprise: a) providing an ink or coating material comprising a fluorescent probe; b) transferring the ink or coating material onto a substrate using a printing process; c) exposing the ink or coating material to actinic radiation capable of initiating cure of the ink or coating material that also alters the luminescence of the probe; d) exposing the ink or coating to a first source of excitation light with wavelength and luminance capable of absorption by the fluorescent probe; and e) measuring the emitted light from the fluorescent probe by a first detector.