POSITIVE TYPE RADIATION-SENSITIVE COMPOSITION AND PROCESS FOR PRODUCING PATTERN WITH THE SAME
申请人:TORAY INDUSTRIES, INC.
公开号:EP1229390A1
公开(公告)日:2002-08-07
The present invention relates to a positive-working radiation-sensitive composition which is characterized in that it contains a compound meeting any of conditions a1) to a3), and b) an acid generator which generates acid by irradiation with radiation; and also to a method for the production of a resist pattern employing same.
a1) A compound wherein a carboxyl group is protected by an acid labile group represented by general formula (1)
(R1 and R2 are aromatic rings, and R3 represents an alkyl group, a substituted alkyl group, a cycloalkyl group or an aromatic ring. R1 to R3 may be the same or different.)
a2) A compound in which an alkali-soluble group is protected by an acid labile group represented by general formula (2)
(R4 to R6 are each an alkyl group, a substituted alkyl group, a cycloalkyl group or an aromatic ring, and at least one of R4 to R6 is an aromatic ring with an electron-donating group. R4 to R6 may be the same or different.)
a3) A compound in which an alkali-soluble group is protected by an acid labile group a, and either acid labile group a has an alkali-soluble group or acid labile group a has an alkali-soluble group protected by an acid labile group b.
With this constitution, it is possible by means of the present invention to obtain a positive-working radiation-sensitive composition of high sensitivity having a resolution which enables sub-quarter micron pattern processing to be carried out.
本发明涉及一种正向工作的辐射敏感组合物,其特征在于它含有符合 a1) 至 a3) 中任一条件的化合物,以及 b) 一种通过辐射产生酸的酸发生器;本发明还涉及一种使用这种组合物生产抗蚀剂图案的方法。
a1)一种化合物,其中的羧基被通式(1)代表的酸性基团所保护
(R1和R2为芳香环,R3代表烷基、取代烷基、环烷基或芳香环。R1 至 R3 可以相同或不同)。
a2)一种化合物,其中的碱溶性基团被通式(2)所代表的酸性基团所保护
(R4至R6各自为烷基、取代烷基、环烷基或芳香环,且R4至R6中至少有一个为带有电子奉献基团的芳香环。R4 至 R6 可以相同或不同)。
a3)碱溶性基团被酸性基团 a 保护,且酸性基团 a 具有碱溶性基团或酸性基团 a 具有被酸性基团 b 保护的碱溶性基团的化合物。
通过这种结构,本发明可以获得一种高灵敏度的正向工作辐射敏感组合物,其分辨率可以进行四分之一微米以下的图案加工。