申请人:FUJI PHOTO FILM CO., LTD.
公开号:US20040232330A1
公开(公告)日:2004-11-25
The present invention provides is a thin film analyzing method which can be applied to various fields, and which makes it possible to detect and analyze in a simple manner, with high precision, a distribution of a specific component in a thin film formed on a support. The method for analyzing a constituent of a thin film comprises a cutting step of cutting the thin film obliquely, and an analyzing step of analyzing a specific component in the cut section of the thin film. In this cutting step, the thin film is preferably cut with a microtome to which a cutting edge made of glass is fitted knife made of glass. The analysis of the distribution of the specific component in the cut section is suitably analyzed by TOF-SIMS or &mgr;-ESCA. The method is particularly useful for analyzing an image recording layer of a planographic printing plate precursor which comprises a water-insoluble and alkali-soluble resin, an infrared ray absorber, and a colorant.
本发明提供了一种薄膜分析方法,该方法可应用于各个领域,并能以简单的方式高精度地检测和分析在支撑物上形成的薄膜中特定成分的分布情况。分析薄膜成分的方法包括斜切薄膜的切割步骤和分析薄膜切割部分中特定成分的分析步骤。在这一切割步骤中,薄膜最好用显微切片机进行切割,在显微切片机上安装由玻璃制成的刀刃。切片中特定成分的分布分析可通过 TOF-SIMS 或 &mgr;-ESCA 进行。该方法特别适用于分析平版印刷板前体的图像记录层,该前体由水不溶性和碱溶性树脂、红外线吸收剂和着色剂组成。