cis-Cu(OC6H4CHNC3H6)2 | 14552-23-9

• 分子结构分类: 有机化合物 - 苯类化合物
• 英文名称: cis-Cu(OC6H4CHNC3H6)2
• 英文别名: N,N'-hexamethylene-bis(salicylaldiminato)copper(II)
• CAS: 14552-23-9；77398-35-7；47457-22-7；77398-34-6
• 化学式: C₂₀H₂₂CuN₂O₂
• 分子量: 385.953
• InChiKey: AXNTVWDZJHRJDT-HYOXNGFTSA-L

计算性质

• 辛醇/水分配系数(LogP)：
  None
• 重原子数：
  None
• 可旋转键数：
  None
• 环数：
  None
• sp3杂化的碳原子比例：
  None
• 拓扑面积：
  None
• 氢给体数：
  None
• 氢受体数：
  None

反应信息

• 作为产物：
  描述：

  (N,N'-hexamethylene bis(salicylaldimine))Cu2Cl2 在 水 作用下， 生成 cis-Cu(OC6H4CHNC3H6)2 、 copper(II) chloride hexahydrate
  参考文献：
  名称：

  Bhattacharya, P. K., Journal of the Indian Chemical Society, 1982, vol. 59, p. 505 - 509

  摘要：

  DOI：

文献信息

• Panova, G. V.; Potapov, V. M.; Turovets, I. M., Journal of general chemistry of the USSR, 1983, vol. 53, p. 1452 - 1458
  作者：Panova, G. V.、Potapov, V. M.、Turovets, I. M.、Golub, E. G.

  DOI：——

  日期：——
• Rakitin, Yu. V.; Kasumov, R. D.; Panova, G. V., Russian Journal of Inorganic Chemistry, 1981, vol. 26, p. 355 - 357
  作者：Rakitin, Yu. V.、Kasumov, R. D.、Panova, G. V.、Turovets, I. M.、Kalinnikov, V. T.

  DOI：——

  日期：——
• The X-ray structures of a series of copper(II) complexes with tetradentate Schiff base ligands derived from salicylaldehyde and polymethylenediamines of varying chain length
  作者：Lawrence C Nathan、Jessica E Koehne、Joshua M Gilmore、Kelly A Hannibal、William E Dewhirst、Tuyetha D Mai

  DOI：10.1016/s0277-5387(03)00029-9

  日期：2003.3

  The structures of six N,N'-polymethylene-bis(salicylaldiminato)copper(II) Schiff base complexes with alkyl backbones ranging from two to eight carbons have been determined by X-ray crystallography. The complexes are monomeric when the alkyl chain length is relatively short (two, three, and four CH2 groups) but are dimers when the chain length becomes longer (five, six, and eight CH2 groups). There is a regular increase in the distortion about the copper center as the alkyl chain length approaches four and five carbons, followed by a decrease as the chains become longer. Previously noted trends in electronic spectral, magnetic susceptibility, and microwave dielectric loss data can be accounted for based on this structural information. (C) 2003 Elsevier Science Ltd. All rights reserved.