Structure-property relationships of benzo[2,1- b :3,4- b ’] bis [1]benzothiophenes for organic field effect transistors
摘要:
A series of novel benzo[2,1-b:3,4-b']bis[1]-benzothiophene (BBBT) derivatives with different side-chains were synthesized and characterized. And their mobility properties were evaluated based on their active layers in OFETs devices. By means of simple thermal annealing, the devices based on BBBT-4 and BBBT-6 exhibited typical p-type FETs behavior with average hole mobilities of 0.28 and 0.124 cm(2) V-1 s(-1), respectively. Furthermore, the structure-property relationships of these semiconductors were also investigated by XRD and AFM. (C) 2018 Elsevier Ltd. All rights reserved.
Structure-property relationships of benzo[2,1- b :3,4- b ’] bis [1]benzothiophenes for organic field effect transistors
摘要:
A series of novel benzo[2,1-b:3,4-b']bis[1]-benzothiophene (BBBT) derivatives with different side-chains were synthesized and characterized. And their mobility properties were evaluated based on their active layers in OFETs devices. By means of simple thermal annealing, the devices based on BBBT-4 and BBBT-6 exhibited typical p-type FETs behavior with average hole mobilities of 0.28 and 0.124 cm(2) V-1 s(-1), respectively. Furthermore, the structure-property relationships of these semiconductors were also investigated by XRD and AFM. (C) 2018 Elsevier Ltd. All rights reserved.
Campaigne,E.; Neiss,E.S., Journal of Heterocyclic Chemistry, 1966, vol. 3, p. 46 - 50
作者:Campaigne,E.、Neiss,E.S.
DOI:——
日期:——
Structure-property relationships of benzo[2,1- b :3,4- b ’] bis [1]benzothiophenes for organic field effect transistors
作者:Kai Zhang、Ji Zhang、Lanqi Huang、Xiaoqin Zhang、Gui Yu、Man Shing Wong
DOI:10.1016/j.tetlet.2018.05.064
日期:2018.7
A series of novel benzo[2,1-b:3,4-b']bis[1]-benzothiophene (BBBT) derivatives with different side-chains were synthesized and characterized. And their mobility properties were evaluated based on their active layers in OFETs devices. By means of simple thermal annealing, the devices based on BBBT-4 and BBBT-6 exhibited typical p-type FETs behavior with average hole mobilities of 0.28 and 0.124 cm(2) V-1 s(-1), respectively. Furthermore, the structure-property relationships of these semiconductors were also investigated by XRD and AFM. (C) 2018 Elsevier Ltd. All rights reserved.